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Publikation
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In: Mechanical Properties of Structural Films, Jg. 2001 (2001), Heft 1413, S. 139-151academicJournalZugriff:
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In: Journal of Testing and Evaluation, Jg. 25 (1997), Heft 1, S. 52-60academicJournalZugriff:
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In: Emerging Semiconductor Technology, Jg. 1987 (1987), Heft 960, S. 51-64academicJournalZugriff:
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In: Emerging Semiconductor Technology, Jg. 1987 (1987), Heft 960, S. 65-78academicJournalZugriff:
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In: Journal of Testing and Evaluation, Jg. 45 (2017-03-01), Heft 2, S. 369-384academicJournalZugriff:
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In: Geotechnical Testing Journal, Jg. 28 (2005-11-01), Heft 6, S. 586-595academicJournalZugriff:
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In: Semiconductor Processing, Jg. 1984 (1984), Heft 850, S. 49-62academicJournalZugriff:
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In: Journal of Testing and Evaluation, Jg. 40 (2012-03-01), Heft 2, S. 256-264academicJournalZugriff:
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In: Semiconductor Processing, Jg. 1984 (1984), Heft 850, S. 533-545academicJournalZugriff:
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In: Skiing Trauma and Safety: Sixth International Symposium, Jg. 1987 (1987), Heft 938, S. 235-248academicJournalZugriff: