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- complementary metal oxide semiconductors 3 Treffer
- logic gates 3 Treffer
- mosfet 2 Treffer
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- electrostatic discharge (esd) 1 Treffer
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- high mobility 1 Treffer
- iii-v mosfets 1 Treffer
- inas 1 Treffer
- junctions 1 Treffer
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- leakage currents 1 Treffer
- logic circuits 1 Treffer
- metal foils 1 Treffer
- metal oxide semiconductors, complementary 1 Treffer
- microwave transmission lines 1 Treffer
- mos devices 1 Treffer
- nanowire 1 Treffer
- nanowires 1 Treffer
- nickel 1 Treffer
- optical films 1 Treffer
- oxide semiconductor 1 Treffer
- performance evaluation 1 Treffer
- photonic band gap 1 Treffer
- pins 1 Treffer
- plastics 1 Treffer
- pnp 1 Treffer
- p-type 1 Treffer
- p-type semiconductors 1 Treffer
- radiation 1 Treffer
- radiation doses 1 Treffer
- radiation hardening (electronics) 1 Treffer
- radiation immunity 1 Treffer
- radio frequency 1 Treffer
- semiconductor manufacturing 1 Treffer
- semiconductor technology 1 Treffer
- silicon 1 Treffer
- silicon-on-insulator 1 Treffer
- silicon-on-insulator metal oxide semiconductor field-effect transistors 1 Treffer
- soi mosfets 1 Treffer
- spectroscopy 1 Treffer
- substrates (materials science) 1 Treffer
- temperature measurement 1 Treffer
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In: IEEE Electron Device Letters, Jg. 32 (2011-11-01), Heft 11, S. 1510-1512Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-02-01), Heft 2, S. 228-231Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-11-01), Heft 11, S. 1814-1817Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 39 (2018-03-01), Heft 3, S. 331-334Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 36 (2015-07-01), Heft 7, S. 663-665Online academicJournalZugriff: