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- metal oxide semiconductors, complementary 357 Treffer
- complementary metal oxide semiconductors 321 Treffer
- detectors 216 Treffer
- integrated circuits 199 Treffer
- radiation effects 169 Treffer
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45 weitere Werte:
- transistors 149 Treffer
- radiation 144 Treffer
- heavy ions 111 Treffer
- digital electronics 109 Treffer
- cmos integrated circuits 103 Treffer
- radiation hardening (electronics) 96 Treffer
- irradiation 93 Treffer
- logic circuits 93 Treffer
- single event effects 93 Treffer
- ionizing radiation 90 Treffer
- random access memory 87 Treffer
- protons 84 Treffer
- cmos 83 Treffer
- silicon 83 Treffer
- semiconductors 81 Treffer
- neutrons 78 Treffer
- logic gates 76 Treffer
- application-specific integrated circuits 69 Treffer
- metal oxide semiconductor field-effect transistors 66 Treffer
- noise 66 Treffer
- cmos technology 61 Treffer
- pixels 61 Treffer
- silicon-on-insulator technology 61 Treffer
- active pixel sensors 58 Treffer
- electronic circuits 58 Treffer
- ions 58 Treffer
- image converters 57 Treffer
- nuclear counters 55 Treffer
- transient errors 54 Treffer
- x-rays 53 Treffer
- electronic amplifiers 51 Treffer
- cmos image sensors 50 Treffer
- photodiodes 48 Treffer
- total ionizing dose (tid) 48 Treffer
- electronics 47 Treffer
- soft errors 47 Treffer
- transient analysis 47 Treffer
- electric potential 46 Treffer
- sensitivity 46 Treffer
- single event upsets 45 Treffer
- dark current 44 Treffer
- temperature measurement 43 Treffer
- effect of radiation complementary metal oxide semiconductors 41 Treffer
- monte carlo method 41 Treffer
- image sensors 39 Treffer
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1.048 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-07-01), Heft 7, S. 1506-1514Online academicJournalZugriff:
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