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In: ETS 2021 - 26th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377787 ; ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-2, ⟨10.1109/ETS50041.2021.9465459⟩, 2021Online KonferenzZugriff:
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In: ETS 2021 - 26th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377787 ; ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-2, ⟨10.1109/ETS50041.2021.9465459⟩, 2021Online KonferenzZugriff:
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In: IEEE European Test Symposium (ETS 2021) ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03377787 ; IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. pp.1-2, ⟨10.1109/ETS50041.2021.9465459⟩, 2021Online KonferenzZugriff:
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In: Faculty Research, Scholarly, and Creative Activity, 2021Online academicJournalZugriff:
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In: Entropy; Volume 23; Issue 9; Pages: 1168, 2021academicJournalZugriff:
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In: Proceedings of PRIME 2018, 2018Online KonferenzZugriff:
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In: Proceedings of PRIME 2018, 2018Online KonferenzZugriff:
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In: TELKOMNIKA Telecommunication, Computing, Electronics and Control 8(3) 162 – 168, 2019academicJournalZugriff:
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In: Journal of Engineering Science and Technology, 2015academicJournalZugriff:
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In: Entropy, 2021Online academicJournalZugriff:
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In: <sygn. PWr A3481II> ; http://aleph.bg.pwr.wroc.pl/F/?func=find-b&request=000122307+&find_code=SYS&adjacent=N&local_base=TUR&x=64&y=13&filter_code_1=WLN&filter_request_1=&filter_code_2=WYR&filter_request_2=&filter_code_3=WYR&filter_request_3=&filter_code_4=WFT&filter_request_4=&filter_code_5=WSB&filter_request_5= ; http://opticaapplicata.pwr.edu.pl/, 2019academicJournalZugriff:
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In: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239247 ; Electronics, 2023, 12 (14), pp.3189. ⟨10.3390/electronics12143189⟩, 2023Online academicJournalZugriff:
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In: Electronics; Volume 12; Issue 14; Pages: 3189, 2023academicJournalZugriff:
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In: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239247 ; Electronics, 2023, 12 (14), pp.3189. ⟨10.3390/electronics12143189⟩, 2023Online academicJournalZugriff:
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In: Electronics, Vol 12, Iss 3189, p 3189 (2023, 2023Online academicJournalZugriff: