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In: PHYSICA STATUS SOLIDI C CONFERENCES, Jg. 11 (2014), Heft 1, S. 61-64KonferenzZugriff:
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In: ACTA PHYSICA POLONICA SERIES A, Jg. 124 (2013), Heft 5, S. 768-771Online KonferenzZugriff:
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In: JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, Jg. 7 (2005), Heft NO 2, S. 599-606KonferenzZugriff:
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In: ACTA PHYSICA POLONICA SERIES A, Jg. 121 (2012), Heft 2, S. 510-513Online KonferenzZugriff:
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In: AIP CONFERENCE PROCEEDINGS, Jg. 1250 (2010), S. 361-364KonferenzZugriff:
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In: AIP CONFERENCE PROCEEDINGS, Jg. 1017 (2008), S. 169-173KonferenzZugriff:
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In: AIP CONFERENCE PROCEEDINGS, Jg. 894 (2007), Heft B, S. 1127-1134KonferenzZugriff:
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In: APPLIED SURFACE SCIENCE, Jg. 208-209 (2003), S. 374-377KonferenzZugriff:
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In: PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Jg. 4762 (2002), S. 139-143KonferenzZugriff:
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Planar, linear and point defects in high purity CVD diamond : Microscopy of semiconducting materialsIn: CONFERENCE SERIES- INSTITUTE OF PHYSICS, 1999, Heft NO 164, S. 85-88KonferenzZugriff:
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In: CONFERENCE SERIES- INSTITUTE OF PHYSICS, 1999, Heft NO 161, S. 413-416KonferenzZugriff:
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In: PROCEEDINGS OF THE ASIA PACIFIC PHYSICS CONFERENCE, Jg. CONF 5 (1994), S. 842-848KonferenzZugriff:
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In: AIP CONFERENCE PROCEEDINGS, Jg. 1328 (2011), S. 177-179KonferenzZugriff:
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In: PROCEEDINGS OF THE ASIA PACIFIC PHYSICS CONFERENCE, 2001, S. 644-646KonferenzZugriff:
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In: IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS, Jg. CONF 35, S. 221-225KonferenzZugriff:
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In: IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS, Jg. CONF 35, S. 201-205KonferenzZugriff:
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In: LNTERNATIENAL CONFERENCE ON PHYSICS AND INDUSTRIAL DEVELOPMENT, , S. 356-364KonferenzZugriff:
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In: MOLECULAR PHYSICS REPORTS, Jg. 21, S. 53-60KonferenzZugriff:
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In: INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, Jg. 1, S. 95-98KonferenzZugriff: