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- integrated circuits 3 Treffer
- electronic circuits 2 Treffer
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45 weitere Werte:
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- critical charge 1 Treffer
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- data analysis 1 Treffer
- dice 1 Treffer
- digital electronics 1 Treffer
- dual-interlocked storage cell (dice) 1 Treffer
- electric transients 1 Treffer
- electronic circuit design 1 Treffer
- electronic systems 1 Treffer
- fault injection 1 Treffer
- fault tolerance 1 Treffer
- fault tolerance (engineering) 1 Treffer
- fault tolerant systems 1 Treffer
- field programmable gate arrays (fpgas) 1 Treffer
- flip-flop 1 Treffer
- flip-flops 1 Treffer
- hardening (heat treatment) 1 Treffer
- heavy ion 1 Treffer
- heavy ions 1 Treffer
- interface circuits 1 Treffer
- ion bombardment 1 Treffer
- latches 1 Treffer
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- microelectronics 1 Treffer
- nonvolatile 1 Treffer
- nonvolatile memory 1 Treffer
- nuclear physics 1 Treffer
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6 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 53 (2006-12-01), Heft 6, S. 3400-3407Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1597-1602Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 53 (2006-08-01), Heft 4, S. 2076-2083Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 53 (2006-06-03), Heft 3, S. 1564-1573Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 59 (2012-04-15), Heft 4, S. 1136-1141Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 57 (2010-12-01), Heft 6, S. 3602-3608Online academicJournalZugriff: