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Sprache
32 Treffer
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In: Low temperature testing of a radiation hardened CMOS 8-bit flash analog-to-digital (A/D) converter [microform] / Scott S. Gerber ... [et al.].; (2001)Online Buch
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In: Silicon-nanocrystal optoelectronic Kerr effect for complementary metal-oxide semiconductor (CMOS) compatible optical switching [electronic resource] / Neal K. Bambha and Justin R. Bickford, Stefan F. Preble.; (2011)Online Buch
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In: CMOS VLSI layout and verification of a SIMD computer [microform] : a thesis ... / by Jianqing Zheng.; (1996)Online Buch
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In: Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / Janet C. Marshall, Mona E. Zaghloul.; (1994)Online Buch
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In: Fabrication and testing of MEMS microgrippers incorporating CMOS electrons / Christopher J. Morris and Kate E. Laflin.; (2010)Online Buch
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In: End-of-fabrication CMOS process monitor [microform] / M.G. Buehler ... [et al.].; (1990)Online Buch
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In: Design and testing guides for the CMOS and lateral bipolar-on-SOI test library [microform] / Janet C. Marshall and Mona E. Zaghloul.; (1994)Online Buch
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In: Development of a radiation-hard CMOS process [microform] : final technical report / by W.L. Power.; (1983)Online Buch
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In: A demonstration of CMOS VLSI circuit prototyping in support of the site facility using 1.2um standard cell library developed by National Security Agency [microform] : final report / by Edwyn D. Smith.; (1991)Online Buch
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In: The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control / Loren W. Linholm.; (1981)Online Buch
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In: Description of CMOS test chip, NBS-39 / T. J. Russell.; (1983)Online Buch
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In: Evaluation of a CMOS/SOS process using process validation wafers / S. E. Suehle; L. W. Linholm; G. M. Marshall.; (1982)Online Buch
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In: CMOS/SOS test patterns for process evaluation and control : annual report, March 1 to November 1, 1978 / Loren W. Linholm.; (1979)Online Buch
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In: NSC 800, 8-bit CMOS microprocessor [microform] : product evaluation report / prepared by Stefan F. Suszko.; (1984)Online Buch
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In: Application of linear response theory to experimental data of simultaneous radiation and annealing response of a CMOS device [microform] / V. Litovchenko; (1988)Online Buch
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In: Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation [microform] / D.S. Woo ; prepared for George C. Marshall Flight Center.; (1982)Online Buch
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In: Description of a CMOS test chip, NBS-39 / T.J. Russell.; (1983)Online Buch
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In: Evaluation of a CMOS/SOS process using process validation wafers / J.S. Suehle, L.W. Linholm, and G.M. Marshall ; prepared for Defense Nuclear Agency.; (1982)Online Buch
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In: The design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control / Loren W. Linholm ; sponsored by U.S. Air Force ... [et al.].; (1981)Online Buch
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In: Latch-up and radiation integrated circuit -- LURIC : a test chip for CMOS latch-up investigation / Donald B. Estreich, Computer-Aided Design Division 2113, Sandia Laboratories ; prepared by Sandia Laboratories for the United States Department of Energy.; (1978)Online Buch