Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- engineered materials, dielectrics and plasmas 20 Treffer
- signal processing and analysis 12 Treffer
- photonics and electrooptics 11 Treffer
- silicon 9 Treffer
- communication, networking and broadcast technologies 8 Treffer
-
45 weitere Werte:
- computing and processing 8 Treffer
- jitter 8 Treffer
- tin 8 Treffer
- hafnium oxide 6 Treffer
- cmos technology 5 Treffer
- fields, waves and electromagnetics 5 Treffer
- logic gates 5 Treffer
- power, energy and industry applications 5 Treffer
- threshold voltage 5 Treffer
- computational modeling 4 Treffer
- deterministic jitter 4 Treffer
- electrostatic discharge 4 Treffer
- high-k gate dielectrics 4 Treffer
- mosfets 4 Treffer
- noise measurement 4 Treffer
- semiconductor device measurement 4 Treffer
- temperature measurement 4 Treffer
- voltage measurement 4 Treffer
- ber 3 Treffer
- bit error rate 3 Treffer
- bit-error rate 3 Treffer
- cmosfets 3 Treffer
- crosstalk 3 Treffer
- data-dependent jitter 3 Treffer
- defects 3 Treffer
- degradation 3 Treffer
- electric breakdown 3 Treffer
- etching 3 Treffer
- high k dielectric materials 3 Treffer
- ieee standards 3 Treffer
- leakage current 3 Treffer
- mos devices 3 Treffer
- mosfet circuits 3 Treffer
- period jitter 3 Treffer
- periodic jitter 3 Treffer
- phase noise 3 Treffer
- pj 3 Treffer
- random jitter 3 Treffer
- scalability 3 Treffer
- semiconductor films 3 Treffer
- semiconductor process modeling 3 Treffer
- substrates 3 Treffer
- timing error 3 Treffer
- timing jitter 3 Treffer
- aerospace 2 Treffer
Verlag
Publikation
- 2007 ieee international electron devices meeting, electron devices meeting, 2007. iedm 2007. ieee international 2 Treffer
- 2008 9th international conference on ultimate integration of silicon, ultimate integration of silicon, 2008. ulis 2008. 9th international conference on 2 Treffer
- conference digest. 2000 conference on lasers and electro-optics europe (cat. no.00th8505), lasers and electro-optics europe, 2000. conference digest. 2000 conference on, laser and electro-optics europe 2 Treffer
- 2004 international conferce on test, test conference, 2004. proceedings. itc 2004. international, international test conference 1 Treffer
- 2006 international electron devices meeting, electron devices meeting, 2006. iedm '06. international 1 Treffer
-
23 weitere Werte:
- 2006 symposium on vlsi technology, 2006. digest of technical papers., vlsi technology, 2006. digest of technical papers. 2006 symposium on 1 Treffer
- 2007 ieee symposium on vlsi technology, vlsi technology, 2007 ieee symposium on 1 Treffer
- 2008 ieee international electron devices meeting, electron devices meeting, 2008. iedm 2008. ieee international 1 Treffer
- 2008 ieee silicon nanoelectronics workshop, silicon nanoelectronics workshop, 2008. snw 2008. ieee 1 Treffer
- 2010 ieee international soi conference (soi), soi conference (soi), 2010 ieee international 1 Treffer
- 2012 ieee international soi conference (soi), soi conference (soi), 2012 ieee international 1 Treffer
- 2014 ieee international symposium on electromagnetic compatibility (emc), electromagnetic compatibility (emc), 2014 ieee international symposium on 1 Treffer
- 2019 ieee 39th international conference on electronics and nanotechnology (elnano), electronics and nanotechnology (elnano), 2019 ieee 39th international conference on 1 Treffer
- 2020 international conference on simulation of semiconductor processes and devices (sispad), simulation of semiconductor processes and devices (sispad), 2020 international conference o 1 Treffer
- 2023 international electron devices meeting (iedm), electron devices meeting (iedm), 2023 international 1 Treffer
- 31st european solid-state device research conference, solid-state device research conference, 2001. proceeding of the 31st european 1 Treffer
- electrical overstress/electrostatic discharge symposium proceedings 2010, electrical overstress/ electrostatic discharge symposium (eos/esd), 2010 32nd 1 Treffer
- esscirc 2021 - ieee 47th european solid state circuits conference (esscirc), solid state circuits conference (esscirc), esscirc 2021 - ieee 47th european 1 Treffer
- esscirc 2022- ieee 48th european solid state circuits conference (esscirc), solid state circuits conference (esscirc), esscirc 2022- ieee 48th european 1 Treffer
- essderc 2008 - 38th european solid-state device research conference, solid-state device research conference, 2008. essderc 2008. 38th european 1 Treffer
- essderc 2021 - ieee 51st european solid-state device research conference (essderc), solid-state device research conference (essderc), essderc 2021 - ieee 51st european 1 Treffer
- essderc 2023 - ieee 53rd european solid-state device research conference (essderc), solid-state device research conference (essderc), essderc 2023 - ieee 53rd european 1 Treffer
- essderc '93: 23rd european solid state device research conference, solid state device research conference, 1993. essderc '93. 23rd european 1 Treffer
- essderc '95: proceedings of the 25th european solid state device research conference, solid state device research conference, 1995. essderc '95. proceedings of the 25th european 1 Treffer
- ieee journal of the electron devices society, electron devices society, ieee journal of the, ieee j. electron devices soc. 1 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 1 Treffer
- ieee transactions on instrumentation and measurement, instrumentation and measurement, ieee transactions on, ieee trans. instrum. meas. 1 Treffer
- proceedings of the 17th international conference mixed design of integrated circuits and systems - mixdes 2010, mixed design of integrated circuits and systems (mixdes), 2010 proceedings of the 17th international conference 1 Treffer
34 Treffer
-
In: IEEE Transactions on Instrumentation and Measurement, Jg. 54 (2005-10-01), Heft 5, S. 1800-1810Online academicJournalZugriff:
-
In: 2023 International Electron Devices Meeting (IEDM), 2023-12-09, S. 1-4KonferenzZugriff:
-
In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC), 2023-09-11, S. 144-147KonferenzZugriff:
-
In: ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC), 2022-09-19, S. 193-196KonferenzZugriff:
-
In: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), 2021-09-13, S. 143-146KonferenzZugriff:
-
In: ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC), 2021-09-13, S. 143-146KonferenzZugriff:
-
In: IEEE Journal of the Electron Devices Society, Jg. 10 (2022), S. 584-592Online academicJournalZugriff:
-
In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2020-09-23, S. 145-148KonferenzZugriff:
-
In: 2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO), 2019-04-01, S. 376-379KonferenzZugriff:
-
In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, 2010-10-01, S. 1-6KonferenzZugriff:
-
In: Proceedings of the 17th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2010, 2010-06-01, S. 30-34KonferenzZugriff:
-
In: IEEE Std 2414-2020, 2021-02-26, S. 1-42RichtlinieZugriff:
-
In: IEEE P2414/D02.3, July 2020, 2020-09-25, S. 1-43RichtlinieZugriff:
-
In: 31st European Solid-State Device Research Conference, 2001, S. 395-398KonferenzZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 56 (2009-07-01), Heft 7, S. 1473-1482Online academicJournalZugriff:
-
In: IEEE P2414/D02.2, April 2019, 2019-07-26, S. 1-40RichtlinieZugriff:
-
In: 2008 IEEE International Electron Devices Meeting, 2008-12-01, S. 1KonferenzZugriff:
-
In: ESSDERC 2008 - 38th European Solid-State Device Research Conference, 2008-09-01, S. 206KonferenzZugriff:
-
In: 2008 IEEE Silicon Nanoelectronics Workshop, 2008-06-01, S. 1KonferenzZugriff:
-
In: 2008 9th International Conference on Ultimate Integration of Silicon, 2008-03-01, S. 31KonferenzZugriff: