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Publikation
- 2016 ieee 22nd international symposium on on-line testing and robust system design (iolts), on-line testing and robust system design (iolts), 2016 ieee 22nd international symposium on 1 Treffer
- ieee transactions on neural networks and learning systems, neural networks and learning systems, ieee transactions on, ieee trans. neural netw. learning syst. 1 Treffer
- issm 2005, ieee international symposium on semiconductor manufacturing, 2005., semiconductor manufacturing, 2005. issm 2005, ieee international symposium on, semiconductor manufacturing 1 Treffer
- proceedings 1998 ieee international symposium on defect and fault tolerance in vlsi systems (cat. no.98ex223), defect and fault tolerance in vlsi systems, 1998. proceedings., 1998 ieee international symposium on, defect and fault tolerance in vlsi systems 1 Treffer
4 Treffer
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In: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2016-07-01, S. 126-129KonferenzZugriff:
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In: ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing,, 2005, S. 381-385KonferenzZugriff:
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In: Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223), 1998, S. 11-16KonferenzZugriff:
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In: IEEE Transactions on Neural Networks and Learning Systems, Jg. PP, Heft 99, S. 1-15academicJournalZugriff: