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- ion 2 Treffer
- iron nitride 2 Treffer
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- monte carlo method 2 Treffer
- nitriding 2 Treffer
- oxide 2 Treffer
- oxygen 2 Treffer
- resolution (electron density) 2 Treffer
- scanning electron microscope 2 Treffer
- silicon 2 Treffer
- stoichiometry 2 Treffer
- thin film 2 Treffer
- titanium 2 Treffer
- titanium nitride 2 Treffer
- [phys]physics [physics] 1 Treffer
- 01 natural sciences 1 Treffer
- 0104 chemical sciences 1 Treffer
- 010402 general chemistry 1 Treffer
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30 Treffer
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In: Surface and Interface Analysis, Jg. 19 (1992-06-01), S. 264-268Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 1 (1979-02-01), S. 20-25Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 12 (1988-07-01), S. 99-104Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 12 (1988-07-01), S. 472-472Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 36 (2004), S. 1402-1412Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 24 (1996-03-01), S. 211-216Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 44 (2012-02-02), S. 953-957Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 40 (2008-12-01), S. 1768-1771Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 39 (2007), S. 519-527Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 39 (2007), S. 359-366Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 38 (2006), S. 620-623Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 34 (2002), S. 253-256Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 33 (2002), S. 461-471Online unknownZugriff:
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Improvement of the depth resolution in sputter depth profiling by elastic peak electron spectroscopyIn: Surface and Interface Analysis, Jg. 33 (2002), S. 635-639Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 28 (1999-08-01), S. 254-257Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 24 (1996-09-16), S. 605-610Online unknownZugriff:
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Target factor and neural network analyses applied to titanium nitride composition recognition by AESIn: Surface and Interface Analysis, Jg. 23 (1995-07-01), S. 495-505Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 23 (1995-06-01), S. 351-362Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 22 (1994-07-01), S. 214-217Online unknownZugriff:
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In: Surface and Interface Analysis, Jg. 20 (1993), S. 10-14Online unknownZugriff: