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Weniger Treffer
Gefunden in
Schlagwort
- materials science 420 Treffer
- optoelectronics 381 Treffer
- electrical and electronic engineering 255 Treffer
- law 212 Treffer
- law.invention 212 Treffer
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45 weitere Werte:
- electronic, optical and magnetic materials 211 Treffer
- mosfet 198 Treffer
- doping 191 Treffer
- transistor 158 Treffer
- cmos 137 Treffer
- chemistry 99 Treffer
- field-effect transistor 99 Treffer
- voltage 93 Treffer
- threshold voltage 87 Treffer
- condensed matter physics 74 Treffer
- hardware_integratedcircuits 73 Treffer
- transconductance 71 Treffer
- gate oxide 70 Treffer
- engineering 68 Treffer
- electric field 64 Treffer
- nmos logic 61 Treffer
- hardware_performanceandreliability 59 Treffer
- chemistry.chemical_compound 56 Treffer
- ion implantation 55 Treffer
- chemistry.chemical_element 54 Treffer
- reliability (semiconductor) 45 Treffer
- drain-induced barrier lowering 43 Treffer
- thin-film transistor 43 Treffer
- communication channel 42 Treffer
- substrate (electronics) 42 Treffer
- hardware_logicdesign 40 Treffer
- silicon 39 Treffer
- equivalent series resistance 38 Treffer
- materials chemistry 38 Treffer
- degradation (geology) 36 Treffer
- pmos logic 36 Treffer
- capacitance 35 Treffer
- breakdown voltage 34 Treffer
- channel length modulation 34 Treffer
- fabrication 32 Treffer
- integrated circuit 32 Treffer
- silicon on insulator 32 Treffer
- oxide 30 Treffer
- electronic engineering 29 Treffer
- leakage (electronics) 29 Treffer
- stress (mechanics) 29 Treffer
- electrostatic discharge 27 Treffer
- electronic circuit 25 Treffer
- very-large-scale integration 25 Treffer
- logic gate 24 Treffer
Verlag
- ieee 169 Treffer
- institute of electrical and electronics engineers (ieee) 164 Treffer
- elsevier bv 49 Treffer
- ire 27 Treffer
- institution of engineering and technology (iet) 16 Treffer
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28 weitere Werte:
- spie 15 Treffer
- wiley 9 Treffer
- informa uk limited 8 Treffer
- springer science and business media llc 5 Treffer
- inst. electr. eng. japan 4 Treffer
- hal ccsd 3 Treffer
- institute of electronics, information and communications engineers (ieice) 3 Treffer
- iop publishing 3 Treffer
- spie press 3 Treffer
- the electrochemical society 3 Treffer
- aip 2 Treffer
- hindawi limited 2 Treffer
- sae international 2 Treffer
- acta physica sinica, chinese physical society and institute of physics, chinese academy of sciences 1 Treffer
- asm international 1 Treffer
- esd assoc 1 Treffer
- hindawi publishing corporation 1 Treffer
- iee 1 Treffer
- ieee comput. soc 1 Treffer
- ieee-inst electrical electronics engineers inc, 445 hoes lane, piscataway, nj 08855 usa 1 Treffer
- pergamon-elsevier science ltd 1 Treffer
- presses polytech. univ. romandes 1 Treffer
- springer us 1 Treffer
- the electrochemical society, pennington, n.j. , stati uniti d'america 1 Treffer
- the japan society of applied physics 1 Treffer
- the korean institute of electrical and electronic material engineers 1 Treffer
- trans tech publications, ltd. 1 Treffer
- zhejiang university press 1 Treffer
Publikation
- ieee transactions on electron devices 89 Treffer
- ieee electron device letters 49 Treffer
- solid-state electronics 33 Treffer
- electronics letters 14 Treffer
- microelectronics reliability 12 Treffer
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45 weitere Werte:
- spie proceedings 12 Treffer
- international technical digest on electron devices meeting 11 Treffer
- 1984 international electron devices meeting 8 Treffer
- ieee journal of solid-state circuits 7 Treffer
- 1986 international electron devices meeting 6 Treffer
- 1987 international electron devices meeting 5 Treffer
- international electron devices meeting 1991 [technical digest] 5 Treffer
- international journal of electronics 5 Treffer
- international technical digest on electron devices 5 Treffer
- sid symposium digest of technical papers 5 Treffer
- technical digest., international electron devices meeting 5 Treffer
- 1985 international electron devices meeting 4 Treffer
- 1990 ieee sos/soi technology conference. proceedings 3 Treffer
- 1991 symposium on vlsi technology 3 Treffer
- digest of technical papers.1990 symposium on vlsi technology 3 Treffer
- ieee circuits and devices magazine 3 Treffer
- ieee transactions on device and materials reliability 3 Treffer
- ieice transactions on electronics 3 Treffer
- journal of semiconductors 3 Treffer
- microelectronics journal 3 Treffer
- 1983 international electron devices meeting 2 Treffer
- 1990 37th ieee international conference on solid-state circuits 2 Treffer
- 2005 ieee conference on electron devices and solid-state circuits 2 Treffer
- 2006 8th international conference on solid-state and integrated circuit technology proceedings 2 Treffer
- 2007 international semiconductor device research symposium 2 Treffer
- 2011 international conference on mechatronic science, electric engineering and computer (mec) 2 Treffer
- aip conference proceedings 2 Treffer
- analog integrated circuits and signal processing 2 Treffer
- ecs transactions 2 Treffer
- electronics and communications in japan (part ii: electronics) 2 Treffer
- icmts 2001. proceedings of the 2001 international conference on microelectronic test structures (cat. no.01ch37153) 2 Treffer
- iee proceedings i solid state and electron devices 2 Treffer
- ieee transactions on nanotechnology 2 Treffer
- ieee transactions on nuclear science 2 Treffer
- iete technical review 2 Treffer
- international electron devices and materials symposium 2 Treffer
- international electron devices meeting 1998. technical digest (cat. no.98ch36217) 2 Treffer
- international electron devices meeting 1999. technical digest (cat. no.99ch36318) 2 Treffer
- journal of display technology 2 Treffer
- journal of electronics (china) 2 Treffer
- proceedings electrical overstress/electrostatic discharge symposium 2 Treffer
- proceedings of 1994 ieee international electron devices meeting 2 Treffer
- proceedings of ieee international electron devices meeting 2 Treffer
- proceedings of the 13th international symposium on power semiconductor devices & ics. ipsd '01 (ieee cat. no.01ch37216) 2 Treffer
- proceedings of the 2005 international conference on microelectronic test structures, 2005. icmts 2005. 2 Treffer
Sprache
514 Treffer
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In: IEEE Transactions on Device and Materials Reliability, Jg. 16 (2016-09-01), S. 298-303Online unknownZugriff:
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In: Electronics Letters, Jg. 51 (2015-07-01), S. 1178-1180Online unknownZugriff:
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In: SAE Technical Paper Series, 2017-01-10Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), S. 705-709Online unknownZugriff:
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In: 2015 International Semiconductor Conference (CAS), 2015-10-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 57 (2010-06-01), S. 1319-1326Online unknownZugriff:
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In: 2015 22nd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2015-07-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 47 (2000-04-01), S. 835-840Online unknownZugriff:
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In: IEICE Transactions on Electronics, 2007-05-01, S. 983-987Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 50 (2003-12-01), S. 2559-2564Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 50 (2003-12-01), S. 2425-2433Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 33 (2012-05-01), S. 682-684Online unknownZugriff:
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In: Solid-State Electronics, Jg. 46 (2002-07-01), S. 965-970Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-06-01), S. 764-766Online unknownZugriff:
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In: Journal of Electronics (China), Jg. 18 (2001-04-01), S. 188-192Online unknownZugriff:
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In: International Symposium for Testing and Failure Analysis, 2013-11-01Online unknownZugriff:
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In: Solid-State Electronics, Jg. 44 (2000-03-01), S. 487-499Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 41 (1994-07-01), S. 1239-1248Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009), S. 88-90Online unknownZugriff:
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In: Journal of Information Display, Jg. 8 (2007), S. 1-5Online unknownZugriff: