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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- atomic force microscopy 3 Treffer
- etude experimentale 3 Treffer
- experimental study 3 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 3 Treffer
- general 3 Treffer
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45 weitere Werte:
- generalites 3 Treffer
- instruments, apparatus, components and techniques common to several branches of physics and astronomy 3 Treffer
- instruments, appareillage, composants et techniques communs a plusieurs branches de la physique et de l'astronomie 3 Treffer
- microelectronic fabrication (materials and surfaces technology) 3 Treffer
- microscopie force atomique 3 Treffer
- pointe microscope 3 Treffer
- atomic force microscopes 2 Treffer
- complementary mos technology 2 Treffer
- dispositif microelectromecanique 2 Treffer
- dispositifs micro- et nanoelectromecaniques (mems/nems) 2 Treffer
- dispositivo microelectromecanico 2 Treffer
- fabrication microelectronique 2 Treffer
- micro- and nanoelectromechanical devices (mems/nems) 2 Treffer
- microelectromechanical device 2 Treffer
- microelectronic fabrication 2 Treffer
- microscope tips 2 Treffer
- microscopes a champ proche, composants et techniques 2 Treffer
- microscopes a force atomique 2 Treffer
- nanotechnologie 2 Treffer
- nanotechnology 2 Treffer
- scanning probe microscopes, components and techniques 2 Treffer
- technologie mos complementaire 2 Treffer
- tecnologia mos complementario 2 Treffer
- aluminium 1 Treffer
- analyse chimique 1 Treffer
- analyse surface 1 Treffer
- atomic force microscope 1 Treffer
- chemical analysis 1 Treffer
- chemical effect 1 Treffer
- circuit integre 1 Treffer
- complementary mos transistor 1 Treffer
- compose hydrophile 1 Treffer
- compose hydrophobe 1 Treffer
- compose mineral 1 Treffer
- compose ternaire 1 Treffer
- compuesto hidrofilo 1 Treffer
- compuesto hidrofobo 1 Treffer
- condensed matter: structure, mechanical and thermal properties 1 Treffer
- cross section 1 Treffer
- diffraction et diffusion d'electrons 1 Treffer
- divers 1 Treffer
- doping profiles 1 Treffer
- edge effect 1 Treffer
- efecto quimico 1 Treffer
- effet bord 1 Treffer
Publikation
- spm 2001 proceedings of the third international conference on scanning probe microscopy, sensors and nanostructures, makuhari, chiba, japan, may 27-31, 2001 1 Treffer
- spm 2002: proceedings of the fourth international conference on scanning probe microscopy, sensors and nanostructures, las vegas, nevada, usa, may 26-29, 2002 1 Treffer
Sprache
5 Treffer
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In: SPM 2001 Proceedings of the Third International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Makuhari, Chiba, Japan, May 27-31, Jg. 91 (2002), Heft 1-4, S. 21-27KonferenzZugriff:
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In: Ultramicroscopy, Jg. 94 (2003), Heft 3-4, S. 277-281academicJournalZugriff:
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In: SPM 2002: Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, Nevada, USA, May 26-29, Jg. 97 (2003), Heft 1-4, S. 467-472KonferenzZugriff:
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In: Ultramicroscopy, Jg. 11 (1983), Heft 4, S. 303-305academicJournalZugriff:
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In: Ultramicroscopy, Jg. 53 (1994), Heft 4, S. 371-380academicJournalZugriff: