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- cmos technology 50 Treffer
- cmos process 22 Treffer
- voltage 21 Treffer
- circuit simulation 16 Treffer
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45 weitere Werte:
- mosfets 14 Treffer
- switches 14 Treffer
- mos devices 13 Treffer
- mosfet circuits 11 Treffer
- radio frequency 11 Treffer
- semiconductor device modeling 11 Treffer
- threshold voltage 11 Treffer
- clocks 10 Treffer
- power dissipation 10 Treffer
- energy consumption 9 Treffer
- integrated circuit technology 9 Treffer
- low voltage 9 Treffer
- bandwidth 7 Treffer
- cmos integrated circuits 7 Treffer
- voltage control 7 Treffer
- voltage-controlled oscillators 7 Treffer
- capacitors 6 Treffer
- frequency 6 Treffer
- leakage current 6 Treffer
- silicon 6 Treffer
- cmos logic circuits 5 Treffer
- degradation 5 Treffer
- equations 5 Treffer
- power supplies 5 Treffer
- analytical models 4 Treffer
- capacitance 4 Treffer
- circuit synthesis 4 Treffer
- costs 4 Treffer
- electrostatic discharge 4 Treffer
- fabrication 4 Treffer
- frequency synthesizers 4 Treffer
- isolation technology 4 Treffer
- logic 4 Treffer
- performance gain 4 Treffer
- phase locked loops 4 Treffer
- resistors 4 Treffer
- silicon on insulator technology 4 Treffer
- switching circuits 4 Treffer
- transconductance 4 Treffer
- very large scale integration 4 Treffer
- analog-digital conversion 3 Treffer
- circuit stability 3 Treffer
- delay 3 Treffer
- delay effects 3 Treffer
- design optimization 3 Treffer
83 Treffer
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 9-14KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 63-66KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 53-56KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 229-232KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 225-228KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 339-342KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 351-354KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 457-460KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 589-592KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 631-634KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 721-724KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 813-816KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 95-98KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 221-224KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 233-236KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 317-320KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 375-378KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 503-506KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 661-664KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 657-660KonferenzZugriff: