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- cmos integrated circuits 49 Treffer
- capacitors 23 Treffer
- logic gates 23 Treffer
- clocks 20 Treffer
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45 weitere Werte:
- transistors 17 Treffer
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- tuning 12 Treffer
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- noise 11 Treffer
- substrates 11 Treffer
- phase locked loops 10 Treffer
- phase noise 10 Treffer
- simulation 10 Treffer
- bandwidth 9 Treffer
- cmos process 9 Treffer
- detectors 9 Treffer
- gain 9 Treffer
- mosfets 9 Treffer
- receivers 9 Treffer
- integrated circuit modeling 8 Treffer
- inverters 8 Treffer
- radio frequency 8 Treffer
- threshold voltage 8 Treffer
- voltage-controlled oscillators 8 Treffer
- calibration 7 Treffer
- capacitance 7 Treffer
- linearity 7 Treffer
- low pass filters 7 Treffer
- radiation detectors 7 Treffer
- resistance 7 Treffer
- topology 7 Treffer
- accuracy 6 Treffer
- arrays 6 Treffer
- frequency conversion 6 Treffer
- frequency synthesizers 6 Treffer
- semiconductor device modeling 6 Treffer
- sensors 6 Treffer
- standards 6 Treffer
- system-on-a-chip 6 Treffer
- temperature sensors 6 Treffer
- dielectrics 5 Treffer
- generators 5 Treffer
- junctions 5 Treffer
- layout 5 Treffer
- micromechanical devices 5 Treffer
- mixers 5 Treffer
145 Treffer
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-4KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-4KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-4KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-4KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-4KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff:
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In: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, 2012-10-01, S. 1-3KonferenzZugriff: