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Weniger Treffer
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- cmos integrated circuits 58 Treffer
- transistors 25 Treffer
- capacitors 22 Treffer
- clocks 20 Treffer
- bandwidth 17 Treffer
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45 weitere Werte:
- logic gates 17 Treffer
- power demand 16 Treffer
- noise 15 Treffer
- delays 13 Treffer
- gain 12 Treffer
- capacitance 11 Treffer
- switches 11 Treffer
- transconductance 10 Treffer
- arrays 9 Treffer
- impedance 9 Treffer
- inverters 9 Treffer
- linearity 8 Treffer
- integrated circuit modeling 7 Treffer
- mosfet 7 Treffer
- radio frequency 7 Treffer
- inductors 6 Treffer
- low power 6 Treffer
- mathematical model 6 Treffer
- modulation 6 Treffer
- resistance 6 Treffer
- sensors 6 Treffer
- voltage control 6 Treffer
- voltage measurement 6 Treffer
- voltage-controlled oscillators 6 Treffer
- calibration 5 Treffer
- cmos technology 5 Treffer
- computer architecture 5 Treffer
- semiconductor device modeling 5 Treffer
- simulation 5 Treffer
- standards 5 Treffer
- system-on-chip 5 Treffer
- wideband 5 Treffer
- band-pass filters 4 Treffer
- cmos 4 Treffer
- cmos process 4 Treffer
- detectors 4 Treffer
- equations 4 Treffer
- regulators 4 Treffer
- sram cells 4 Treffer
- temperature sensors 4 Treffer
- 1f noise 3 Treffer
- all-pass filter 3 Treffer
- current follower 3 Treffer
- dynamic range 3 Treffer
- electroencephalography 3 Treffer
112 Treffer
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 414-417KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 683-686KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 933-936KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 961-964KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 9-12KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 173-176KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 181-184KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 274-277KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 394-397KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 390-393KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 418-421KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 837-840KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 868-871KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 897-900KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 957-960KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 941-944KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 945-948KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 81-84KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 101-104KonferenzZugriff:
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In: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), 2014-08-01, S. 382-385KonferenzZugriff: