Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
- Entferne Filter: Schlagwort: photonics and electrooptics
- Entferne Filter: Schlagwort: signal processing and analysis
- Entferne Filter: Schlagwort: semiconductor device modeling
- Entferne Filter: Publikation: 2022 ieee latin american electron devices conference (laedc), electron devices conference (laedc), 2022 ieee latin american
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- mosfet 3 Treffer
- degradation 2 Treffer
- analytical models 1 Treffer
- anisotropic magnetoresistance 1 Treffer
- capacitance 1 Treffer
-
30 weitere Werte:
- cmos 1 Treffer
- computational modeling 1 Treffer
- conductivity 1 Treffer
- cryo-cmos 1 Treffer
- cryogenic electronics 1 Treffer
- detectors 1 Treffer
- electrical characterization 1 Treffer
- electron devices 1 Treffer
- layout 1 Treffer
- mobility degradation 1 Treffer
- mosfet circuits 1 Treffer
- negative capacitance effect 1 Treffer
- organic ferroelectric 1 Treffer
- parasitic series resistance 1 Treffer
- plasma waves 1 Treffer
- plasmons 1 Treffer
- post-cmos 1 Treffer
- preisach model 1 Treffer
- radiation detectors 1 Treffer
- radiation hardening (electronics) 1 Treffer
- resistance 1 Treffer
- sensitivity analysis 1 Treffer
- silicon 1 Treffer
- solid modeling 1 Treffer
- subthreshold current 1 Treffer
- temperature distribution 1 Treffer
- temperature measurement 1 Treffer
- three-dimensional displays 1 Treffer
- total ionizing dose 1 Treffer
- voltage 1 Treffer
4 Treffer
-
In: 2022 IEEE Latin American Electron Devices Conference (LAEDC), 2022-07-04, S. 1-4KonferenzZugriff:
-
In: 2022 IEEE Latin American Electron Devices Conference (LAEDC), 2022-07-04, S. 1-4KonferenzZugriff:
-
In: 2022 IEEE Latin American Electron Devices Conference (LAEDC), 2022-07-04, S. 1-4KonferenzZugriff:
-
In: 2022 IEEE Latin American Electron Devices Conference (LAEDC), 2022-07-04, S. 1-5KonferenzZugriff: