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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- condensed matter: electronic structure, electrical, magnetic, and optical properties 13 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 13 Treffer
- density functional method 11 Treffer
- methode fonctionnelle densite 11 Treffer
- approximation densite locale 10 Treffer
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45 weitere Werte:
- aproximacion densidad local 10 Treffer
- compose mineral 10 Treffer
- condensed matter: structure, mechanical and thermal properties 10 Treffer
- electronic structure 10 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 10 Treffer
- local density approximation 10 Treffer
- structure electronique 10 Treffer
- electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures 7 Treffer
- inorganic compounds 7 Treffer
- structure electronique et proprietes electriques des surfaces, interfaces, couches minces et structures de basse dimensionnalite 7 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 7 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 7 Treffer
- band structure 6 Treffer
- etude theorique 6 Treffer
- structure bande 6 Treffer
- theoretical study 6 Treffer
- ab initio calculations 5 Treffer
- calcul ab initio 5 Treffer
- electron states 5 Treffer
- etats electroniques 5 Treffer
- etats electroniques de surface et d'interface 5 Treffer
- metal transition compose 5 Treffer
- solid surfaces and solid-solid interfaces 5 Treffer
- surface and interface electron states 5 Treffer
- surfaces solides et interfaces solide-solide 5 Treffer
- density functional theory, local density approximation 4 Treffer
- etats de surface, structure de bande, densite d'etats electroniques 4 Treffer
- methodes de calcul de structure electronique 4 Treffer
- methods of electronic structure calculations 4 Treffer
- semiconductor materials 4 Treffer
- si 4 Treffer
- silicium 4 Treffer
- silicon 4 Treffer
- structure surface 4 Treffer
- surface states, band structure, electron density of states 4 Treffer
- surface structure 4 Treffer
- atomic structure 3 Treffer
- cross-disciplinary physics: materials science; rheology 3 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 3 Treffer
- etat surface 3 Treffer
- materiau semiconducteur 3 Treffer
- structure atomique 3 Treffer
- surface states 3 Treffer
- transition element compounds 3 Treffer
- 71.15.hx 2 Treffer
Publikation
- acsin8/ictf13: proceedings of the eighth international conference on atomically controlled surfaces, interfaces and nanostructures and the thirteenth international congress on thin films, stockholm, sweden, june 20-23, 2005 2 Treffer
- proceedings of the seventh international conference on the formation of semiconductor interfaces, goteborg, sweden, june 21-25, 1999 2 Treffer
- aphys2003 1 Treffer
- icsfs-10: proceedings of the tenth international conference on solid films and surfaces, princeton, new jersey, july 9-13, 2000 1 Treffer
- nc-afm'99: proceedings of the second international workshop on noncontact atomic force microscopy, pontresina, switzerland, september 1-4, 1999 1 Treffer
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7 weitere Werte:
- proceedings of applied surface modeling: experiment, theory and simulations, cleveland, united states of america, august 21-23, 2002 1 Treffer
- proceedings of the eighth international conference on the formation of semiconductor interfaces, sapporo, japan, june 10-15, 2001 1 Treffer
- proceedings of the european materials research society 2001-symposium f amorphous and crystalline silicon carbide: material and applications 1 Treffer
- proceedings of the ninth international conference on solid films and surfaces, copenhagen, denmark, july 6-10, 1998 1 Treffer
- secondary ion mass spectrometry sims xiii: proceedings of the thirteenth international conference on secondary ion mass spectrometry and related topics nara-ken new public hall, nara, japan, november 11-16, 2001 1 Treffer
- surface science approach to stress and strain in epitaxy 1 Treffer
- the ninth international conference on the formation of semiconductor interfaces, icfsi-9, madrid, etsii, spain, september 15-19, 2003 1 Treffer
Sprache
18 Treffer
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In: The Ninth International Conference on the Formation of Semiconductor Interfaces, ICFSI-9, Madrid, ETSII, Spain, September 15-19, 2003, Jg. 234 (2004), Heft 1-4, S. 302-306KonferenzZugriff:
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In: Secondary Ion Mass Spectrometry SIMS XIII: Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Jg. 203-04 (2003), S. 698-703KonferenzZugriff:
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In: ACSIN8/ICTF13: Proceedings of the Eighth International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures and the Thirteenth International Congress on Thin Films, Stockholm, Sweden, June 20-23, 2005, Jg. 252 (2006), Heft 15, S. 5361-5364KonferenzZugriff:
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In: APHYS2003, Jg. 238 (2004), Heft 1-4, S. 36-41KonferenzZugriff:
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In: Proceedings of Applied Surface Modeling: Experiment, Theory and Simulations, Cleveland, United States of America, August 21-23, 2002, Jg. 219 (2003), Heft 1-2, S. 158-166KonferenzZugriff:
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In: Proceedings of the Eighth International Conference on the Formation of Semiconductor Interfaces, Sapporo, Japan, June 10-15, 2001, Jg. 190 (2002), Heft 1-4, S. 475-479KonferenzZugriff:
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In: Surface science approach to stress and strain in epitaxy, Jg. 177 (2001), Heft 4, S. 230-237KonferenzZugriff:
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In: Proceedings of the European Materials Research Society 2001-Symposium F Amorphous and Crystalline Silicon Carbide: Material and Applications, Jg. 184 (2001), Heft 1-4, S. 194-198KonferenzZugriff:
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In: ICSFS-10: Proceedings of the Tenth International Conference on Solid Films and Surfaces, Princeton, New Jersey, July 9-13, 2000, Jg. 175-76 (2001), S. 207-211KonferenzZugriff:
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In: NC-AFM'99: Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, September 1-4, 1999, Jg. 157 (2000), Heft 4, S. 367-372KonferenzZugriff:
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In: Proceedings of the Seventh International Conference on the Formation of Semiconductor Interfaces, Göteborg, Sweden, June 21-25, 1999, Jg. 166 (2000), S. 201-208KonferenzZugriff:
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In: Proceedings of the Seventh International Conference on the Formation of Semiconductor Interfaces, Göteborg, Sweden, June 21-25, 1999, Jg. 166 (2000), S. 179-184KonferenzZugriff:
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In: Proceedings of the Ninth International Conference on Solid Films and Surfaces, Copenhagen, Denmark, July 6-10, 1998, Jg. 142 (1999), Heft 1-4, S. 52-57KonferenzZugriff:
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In: ACSIN8/ICTF13: Proceedings of the Eighth International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures and the Thirteenth International Congress on Thin Films, Stockholm, Sweden, June 20-23, 2005, Jg. 252 (2006), Heft 15, S. 5365-5367KonferenzZugriff:
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In: Applied surface science, Jg. 253 (2007), Heft 20, S. 8345-8351academicJournalZugriff:
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In: Applied surface science, Jg. 242 (2005), Heft 1-2, S. 121-128academicJournalZugriff:
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In: Applied surface science, Jg. 239 (2004), Heft 1, S. 101-108academicJournalZugriff:
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In: Applied surface science, Jg. 172 (2001), Heft 1-2, S. 41-46academicJournalZugriff: