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In: Chinese Physics C, Jg. 32 (2008-06-01), S. 442-445Online unknownZugriff:
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A comparison of ionizing radiation damage in CMOS devices from60Co gamma rays, electrons and protonsIn: Chinese Physics C, Jg. 33 (2009-06-01), S. 436-439Online unknownZugriff:
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In: Chinese Physics C, Jg. 35 (2011-03-01), S. 278-281Online unknownZugriff:
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In: Chinese Physics C, Jg. 41 (2017-06-01), S. 066101-66101Online unknownZugriff:
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A novel simulation method to evaluate the collection performance of a monolithic active pixel sensorIn: Chinese Physics C, Jg. 35 (2011-10-01), S. 940-945Online unknownZugriff:
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In: Chinese Physics C, Jg. 40 (2016-06-01), S. 066101-66101Online unknownZugriff:
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In: Chinese Physics C, Jg. 33 (2009-06-01), Heft 6, S. 1-1Online academicJournalZugriff:
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In: Chinese Physics C, Jg. 32 (2008-06-01), Heft 6, S. 1-1Online academicJournalZugriff:
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In: Chinese Physics C, Jg. 38 (2014-10-01), S. 106101-106101Online unknownZugriff: