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- cmos integrated circuits 335 Treffer
- complementary metal oxide semiconductors 326 Treffer
- cmos technology 126 Treffer
- cmos analogue integrated circuits 121 Treffer
- low-power electronics 96 Treffer
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45 weitere Werte:
- size 0.18 mum 96 Treffer
- cmos process 88 Treffer
- size 65 nm 66 Treffer
- power consumption 62 Treffer
- integrated circuit design 61 Treffer
- electric potential 60 Treffer
- operational amplifiers 55 Treffer
- digital electronics 50 Treffer
- energy consumption 47 Treffer
- bandwidths 42 Treffer
- capacitors 41 Treffer
- electronic amplifiers 41 Treffer
- voltage 1.2 v 41 Treffer
- voltage-controlled oscillators 41 Treffer
- low noise amplifiers 40 Treffer
- transistors 40 Treffer
- uhf integrated circuits 40 Treffer
- analogue-digital conversion 38 Treffer
- cmos digital integrated circuits 37 Treffer
- integrated circuits 34 Treffer
- phase noise 34 Treffer
- power amplifiers 32 Treffer
- electric oscillators 30 Treffer
- cmos 29 Treffer
- cmos image sensors 29 Treffer
- silicon 29 Treffer
- size 0.13 mum 29 Treffer
- voltage 1.8 v 29 Treffer
- field effect mmic 27 Treffer
- mosfet 27 Treffer
- size 90 nm 26 Treffer
- cmos logic circuits 25 Treffer
- si 24 Treffer
- frequency dividers 23 Treffer
- calibration 22 Treffer
- radio frequency 22 Treffer
- size 0.35 mum 22 Treffer
- time-digital conversion 22 Treffer
- clocks 21 Treffer
- detectors 21 Treffer
- electric power consumption 21 Treffer
- size 180 nm 21 Treffer
- size 28 nm 21 Treffer
- logic circuits 20 Treffer
- signal-to-noise ratio 20 Treffer
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Geographischer Bezug
1.128 Treffer
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-10-01), Heft 19, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-01), Heft 15, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-06-01), Heft 11, S. 1-4Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-03-01), Heft 5, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 58 (2022-03-15), Heft 6, S. 228-230Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-05-01), Heft 9, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-05-01), Heft 9, S. 1-4Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-12-01), Heft 23, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-10-15), Heft 20, S. 1-4Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-15), Heft 16, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-08-01), Heft 15, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 57 (2021-07-01), Heft 14, S. 545-547Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-03-15), Heft 6, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-26), Heft 24, S. 1335-1337Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-26), Heft 24, S. 1301-1303Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-12), Heft 23, S. 1230-1232Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-12), Heft 23, S. 1239-1241Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-09-01), Heft 17, S. 1-3Online academicJournalZugriff:
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In: Electronics Letters (Wiley-Blackwell), Jg. 59 (2023-07-15), Heft 14, S. 1-3Online academicJournalZugriff:
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Radio frequency reliability studies of CMOS RF integrated circuits for ultra-thin flexible packages.In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-03-17), Heft 6, S. 280-282Online academicJournalZugriff: