Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- voltage-controlled oscillators 18 Treffer
- cmos analogue integrated circuits 10 Treffer
- cmos integrated circuits 8 Treffer
- integrated circuit noise 8 Treffer
- complementary metal oxide semiconductors 7 Treffer
-
45 weitere Werte:
- uhf integrated circuits 7 Treffer
- uhf oscillators 7 Treffer
- frequencies of oscillating systems 6 Treffer
- mmic oscillators 6 Treffer
- size 0.13 mum 5 Treffer
- cmos process 4 Treffer
- cmos technology 4 Treffer
- power consumption 4 Treffer
- size 65 nm 4 Treffer
- electric oscillator noise 3 Treffer
- electric power consumption 3 Treffer
- injection locked oscillators 3 Treffer
- low-power electronics 3 Treffer
- phase-locked loops 3 Treffer
- size 180.0 nm 3 Treffer
- capacitors 2 Treffer
- circuit tuning 2 Treffer
- colpitts oscillators 2 Treffer
- electric transformers 2 Treffer
- field effect mimic 2 Treffer
- field effect mmic 2 Treffer
- figure of merit 2 Treffer
- figure-of-merit 2 Treffer
- fom 2 Treffer
- frequency 1.0 mhz 2 Treffer
- frequency dividers 2 Treffer
- lc circuits 2 Treffer
- microwave filters 2 Treffer
- microwave integrated circuits 2 Treffer
- millimetre wave oscillators 2 Treffer
- oscillation frequency 2 Treffer
- phase detectors 2 Treffer
- phase locked loops 2 Treffer
- radio frequency 2 Treffer
- si 2 Treffer
- silicon-on-insulator 2 Treffer
- standard cmos process 2 Treffer
- transformers 2 Treffer
- varactors 2 Treffer
- vco 2 Treffer
- voltage 0.45 v 2 Treffer
- voltage 1.3 v 2 Treffer
- voltage 1.8 v 2 Treffer
- 1/f noise 1 Treffer
- active devices 1 Treffer
Sprache
35 Treffer
-
In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-11-26), Heft 24, S. 1301-1303Online academicJournalZugriff:
-
Radio frequency reliability studies of CMOS RF integrated circuits for ultra-thin flexible packages.In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-03-17), Heft 6, S. 280-282Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 58 (2022-12-01), Heft 25, S. 946-948Online academicJournalZugriff:
-
Radio frequency reliability studies of CMOS RF integrated circuits for ultra‐thin flexible packages.In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020-03-01), Heft 5, S. 280-282Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 54 (2018-02-01), Heft 3, S. 175-177Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 55 (2019-05-01), Heft 11, S. 581-583Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 53 (2017-10-01), Heft 21, S. 1460-1462Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 50 (2014-06-01), Heft 13, S. 855-857Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 50 (2014-03-01), Heft 7, S. 434-436Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 55 (2019-05-16), Heft 10, S. 581-582Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 54 (2018-02-08), Heft 3, S. 175-176Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 60 (2024-01-15), Heft 2, S. 1-3Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 52 (2016-07-21), Heft 15, S. 1298-1299Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 50 (2014-06-05), Heft 12, S. 855-856Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 56 (2020), Heft 2, S. 76-78Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 54 (2018-03-01), Heft 6, S. 342-344Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 54 (2018-05-01), Heft 9, S. 689-691Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 52 (2016-03-01), Heft 5, S. 462-464Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 51 (2015-05-01), Heft 10, S. 832-834Online academicJournalZugriff:
-
In: Electronics Letters (Wiley-Blackwell), Jg. 51 (2015), Heft 2, S. 161-162Online academicJournalZugriff: