Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
- Entferne Filter: Schlagwort: clocks
- Entferne Filter: Schlagwort: components, circuits, devices and systems
- Entferne Filter: Schlagwort: engineered materials, dielectrics and plasmas
- Entferne Filter: Publikation: ieee asian solid-state circuits conference 2011, solid state circuits conference (a-sscc), 2011 ieee asian
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- delay 7 Treffer
- cmos integrated circuits 6 Treffer
- calibration 5 Treffer
- modulation 5 Treffer
- capacitors 4 Treffer
-
45 weitere Werte:
- switches 4 Treffer
- jitter 3 Treffer
- noise 3 Treffer
- quantization 3 Treffer
- voltage control 3 Treffer
- arrays 2 Treffer
- bandwidth 2 Treffer
- frequency measurement 2 Treffer
- logic gates 2 Treffer
- phase locked loops 2 Treffer
- radio frequency 2 Treffer
- receivers 2 Treffer
- silicon 2 Treffer
- throughput 2 Treffer
- transistors 2 Treffer
- transmitters 2 Treffer
- voltage measurement 2 Treffer
- analog circuits 1 Treffer
- analog-to-digital converter (adc) 1 Treffer
- band pass filters 1 Treffer
- bit error rate 1 Treffer
- body bias 1 Treffer
- channel estimation 1 Treffer
- charge pumps 1 Treffer
- clock generator 1 Treffer
- cmos 1 Treffer
- correlators 1 Treffer
- decoding 1 Treffer
- dynamic range 1 Treffer
- electrocardiography 1 Treffer
- elliptic curve cryptography 1 Treffer
- energy consumption 1 Treffer
- energy dissipation 1 Treffer
- equalizers 1 Treffer
- feature extraction 1 Treffer
- feedforward neural networks 1 Treffer
- field programmable gate arrays 1 Treffer
- flash adc 1 Treffer
- forward bias 1 Treffer
- frequency control 1 Treffer
- frequency domain analysis 1 Treffer
- frequency modulation 1 Treffer
- generators 1 Treffer
- information filters 1 Treffer
- integrated circuits 1 Treffer
23 Treffer
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 277-280KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 29-32KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 257-260KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 317-320KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 337-340KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 133-136KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 233-236KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 253-256KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 213-216KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 349-352KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 73-76KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 217-220KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 393-396KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 265-268KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 293-296KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 301-304KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 305-308KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 325-328KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 45-48KonferenzZugriff:
-
In: IEEE Asian Solid-State Circuits Conference 2011, 2011-11-01, S. 377-380KonferenzZugriff: