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- solid state circuits 75 Treffer
- transistors 63 Treffer
- capacitors 57 Treffer
- clocks 57 Treffer
- cmos 56 Treffer
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45 weitere Werte:
- switches 50 Treffer
- bandwidth 41 Treffer
- gain 41 Treffer
- logic gates 40 Treffer
- delays 37 Treffer
- impedance 32 Treffer
- temperature measurement 32 Treffer
- voltage control 31 Treffer
- receivers 30 Treffer
- power demand 29 Treffer
- radio frequency 29 Treffer
- voltage measurement 28 Treffer
- frequency measurement 27 Treffer
- voltage-controlled oscillators 27 Treffer
- detectors 25 Treffer
- computer architecture 23 Treffer
- jitter 23 Treffer
- calibration 22 Treffer
- low power 21 Treffer
- mixers 21 Treffer
- phase locked loops 21 Treffer
- semiconductor device measurement 21 Treffer
- system-on-chip 20 Treffer
- linearity 19 Treffer
- random access memory 19 Treffer
- timing 19 Treffer
- tuning 19 Treffer
- capacitance 18 Treffer
- sensors 18 Treffer
- voltage 17 Treffer
- inverters 16 Treffer
- phase noise 16 Treffer
- temperature sensors 16 Treffer
- analog-to-digital converter (adc) 15 Treffer
- inductors 15 Treffer
- resistors 15 Treffer
- topology 15 Treffer
- cmos technology 14 Treffer
- generators 14 Treffer
- harmonic analysis 14 Treffer
- power generation 14 Treffer
- quantization (signal) 14 Treffer
- resistance 14 Treffer
- sensitivity 14 Treffer
- switching circuits 13 Treffer
343 Treffer
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In: IEEE Solid-State Circuits Letters, Jg. 7 (2024), S. 50-53Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 7 (2024), S. 147-150Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 125-128Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 177-180Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 1-4Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 197-200Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 253-256Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 245-248Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 241-244Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 277-280Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 5 (2022), S. 114-117Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 5 (2022), S. 146-149Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 5 (2022), S. 218-221Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 101-104Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 237-240Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 77-80Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 185-188Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 4 (2021), S. 210-213Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 4 (2021), S. 96-99Online academicJournalZugriff:
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In: IEEE Solid-State Circuits Letters, Jg. 6 (2023), S. 221-224Online academicJournalZugriff: