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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-09-01), Heft 9, S. 3650-3654Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-12-01), Heft 12, S. 5006-5011Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-09-01), Heft 9, S. 3678-3682Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-08-01), Heft 8, S. 3246-3251Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), Heft 12, S. 6255-6261Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-11-01), Heft 11, S. 5640-5644Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-08-01), Heft 8, S. 3894-3900Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-11-01), Heft 11, S. 4958-4962Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 67 (2020-11-01), Heft 11, S. 4953-4957Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-10-01), Heft 10, S. 4211-4215Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-12-01), Heft 12, S. 3250-3254Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-03-01), Heft 3, S. 360-366Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-05-01), Heft 5, S. 2010-2015Online academicJournalZugriff: