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88 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 5028-5034Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-08-01), Heft 8, S. 4686-4692Online academicJournalZugriff:
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Investigation of p-GaN/N-Mg₀.₃Zn₀.₇O:In Heterojunction Photodiode for Dual-Band UV-B/UV-A Detection.In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 2886-2893Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-02-01), Heft 2, S. 597-603Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-12-01), Heft 12, S. 6558-6562Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-04-01), Heft 4, S. 1886-1891Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-06-01), Heft 6, S. 2595-2599Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 63 (2016-08-01), Heft 8, S. 3076-3083Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 62 (2015-11-01), Heft 11, S. 3658-3664Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 61 (2014-12-01), Heft 12, S. 4098-4104Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-11-01), Heft 11, S. 3625-3631Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-04-01), Heft 4, S. 1149-1154Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), Heft 3, S. 700-704Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), Heft 3, S. 754-760Online academicJournalZugriff:
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Nonsaturating Drain Current Characteristic in Short-Channel Amorphous-Silicon Thin-Film Transistors.In: IEEE Transactions on Electron Devices, Jg. 57 (2010-04-01), Heft 4, S. 846-854Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-08-01), Heft 8, S. 1722-1726Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), Heft 4, S. 438-446Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 51 (2004-11-01), Heft 11, S. 1811-1817Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 51 (2004-10-01), Heft 10, S. 1667-1671Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 49 (2002-09-01), Heft 9, S. 1566-1571Online academicJournalZugriff: