Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- chemical vapor deposition 161 Treffer
- silicon 41 Treffer
- metal oxide semiconductor field-effect transistors 36 Treffer
- thin films 35 Treffer
- plasma-enhanced chemical vapor deposition 30 Treffer
-
45 weitere Werte:
- dielectrics 27 Treffer
- transistors 26 Treffer
- field-effect transistors 23 Treffer
- semiconductors 20 Treffer
- logic gates 19 Treffer
- thin film transistors 19 Treffer
- metal oxide semiconductors, complementary 17 Treffer
- solar cells 16 Treffer
- substrates 16 Treffer
- graphene 15 Treffer
- bipolar transistors 14 Treffer
- pecvd processes 14 Treffer
- chemical vapor deposition (cvd) 13 Treffer
- germanium 13 Treffer
- computer simulation of current-voltage characteristics 12 Treffer
- current-voltage characteristics -- computer simulation 12 Treffer
- electronics 12 Treffer
- gallium nitride 12 Treffer
- metal oxide semiconductors 12 Treffer
- capacitors 11 Treffer
- dielectric films 11 Treffer
- epitaxy 11 Treffer
- silicon carbide 11 Treffer
- silicon nitride 11 Treffer
- integrated circuit interconnections 10 Treffer
- metal organic chemical vapor deposition 10 Treffer
- rapid thermal processing 10 Treffer
- vapor-plating 10 Treffer
- breakdown voltage 9 Treffer
- computer simulation 9 Treffer
- electron mobility 9 Treffer
- integrated circuits 9 Treffer
- mathematical models 9 Treffer
- semiconductor doping 9 Treffer
- silicon films 9 Treffer
- annealing of metals 8 Treffer
- boron 8 Treffer
- heterojunctions 8 Treffer
- diodes 7 Treffer
- electric potential 7 Treffer
- metal semiconductor field-effect transistors 7 Treffer
- nanowires 7 Treffer
- silica films 7 Treffer
- silicon nitride films 7 Treffer
- silicon-on-insulator technology 7 Treffer
Sprache
238 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-03-01), Heft 3, S. 1196-1199Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 66 (2019-12-01), Heft 12, S. 5381-5386Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 66 (2019), Heft 1, S. 378-382Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 65 (2018-10-01), Heft 10, S. 4129-4134Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 65 (2018-08-01), Heft 8, S. 3257-3263Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 65 (2018-10-01), Heft 10, S. 4040-4052Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 63 (2016-12-01), Heft 12, S. 4693-4701Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 4340-4345Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 66 (2019), Heft 1, S. 743-751Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 62 (2015-11-01), Heft 11, S. 3640-3644Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 59 (2012-05-01), Heft 5, S. 1445-1453Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 64 (2017-06-01), Heft 6, S. 2498-2504Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 62 (2015-12-01), Heft 12, S. 4340-4344Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 44 (1997-03-01), Heft 3, S. 431-440Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-03-01), Heft 3, S. 1083-1091Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-08-01), Heft 8, S. 4469-4473Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 3386-3392Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 49 (2002-05-01), Heft 5, S. 733-738Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 46 (1999-10-01), Heft 10, S. 2048-2054Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 45 (1998-12-01), Heft 12, S. 2499-2504Online academicJournalZugriff: