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- logic gates 3 Treffer
- silicon 3 Treffer
- finfet 2 Treffer
- logic circuits 2 Treffer
- silicon germanium 2 Treffer
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45 weitere Werte:
- tunneling 2 Treffer
- annealing of metals 1 Treffer
- band-to-band tunneling 1 Treffer
- band-to-band tunneling (btbt) 1 Treffer
- boron 1 Treffer
- charge carrier processes 1 Treffer
- charge carriers 1 Treffer
- charge pumping 1 Treffer
- chemical vapor deposition 1 Treffer
- chemical vapor deposition (cvd) 1 Treffer
- delta doping 1 Treffer
- dielectrics 1 Treffer
- doping 1 Treffer
- dry cleaning 1 Treffer
- electron mobility 1 Treffer
- epitaxy 1 Treffer
- field-effect transistors 1 Treffer
- finfets 1 Treffer
- gallium arsenide 1 Treffer
- gate-all-around (gaa) 1 Treffer
- hafnium 1 Treffer
- heterojunctions 1 Treffer
- high-pressure annealing 1 Treffer
- hydrogen 1 Treffer
- metal oxide semiconductors 1 Treffer
- nanowires 1 Treffer
- on-chip charge pumps 1 Treffer
- oxidation 1 Treffer
- positive bias temperature instability (pbti) 1 Treffer
- quantum wells 1 Treffer
- reliability 1 Treffer
- reliability in engineering 1 Treffer
- resonant tunneling 1 Treffer
- semiconductor doping 1 Treffer
- semiconductor doping profiles 1 Treffer
- semiconductor process modeling 1 Treffer
- semiconductor wafers 1 Treffer
- si 1 Treffer
- sige 1 Treffer
- silicon germanium integrated circuits 1 Treffer
- silicon wafer cleaning 1 Treffer
- standards 1 Treffer
- strain 1 Treffer
- strained germanium 1 Treffer
- surface preparation 1 Treffer
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4 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 66 (2019-12-01), Heft 12, S. 5387-5392Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4587-4593Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 61 (2014-12-01), Heft 12, S. 4032-4039Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-03-01), Heft 3, S. 602-609Online academicJournalZugriff: