Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- computing-in-memory (cim) 11 Treffer
- common information model (computing) 8 Treffer
- resistance 7 Treffer
- performance evaluation 6 Treffer
- random access memory 6 Treffer
-
45 weitere Werte:
- compute-in-memory (cim) 5 Treffer
- computer architecture 5 Treffer
- nonvolatile memory 5 Treffer
- resistive random access memory (rram) 5 Treffer
- switches 5 Treffer
- transistors 5 Treffer
- arrays 4 Treffer
- computational modeling 4 Treffer
- programming 4 Treffer
- training 4 Treffer
- analog resistive random access memory (rram) 3 Treffer
- binary neural network (bnn) 3 Treffer
- logic gates 3 Treffer
- magnetic tunneling 3 Treffer
- microprocessors 3 Treffer
- reliability 3 Treffer
- voltage 3 Treffer
- benchmark testing 2 Treffer
- carbon nanotube (cnt) 2 Treffer
- cmos logic 2 Treffer
- computation-in-memory (cim) 2 Treffer
- degradation 2 Treffer
- emerging nonvolatile memory (envm) 2 Treffer
- hafnium oxide 2 Treffer
- junctions 2 Treffer
- latches 2 Treffer
- magnetic memory 2 Treffer
- memory management 2 Treffer
- memristors 2 Treffer
- neural network (nn) 2 Treffer
- neurons 2 Treffer
- phase change materials 2 Treffer
- power demand 2 Treffer
- silicon 2 Treffer
- spintronics 2 Treffer
- temperature measurement 2 Treffer
- torque 2 Treffer
- advanced encryption standard (aes) 1 Treffer
- artificial intelligence 1 Treffer
- artificial neural networks 1 Treffer
- artificial synapse 1 Treffer
- ash 1 Treffer
- behavioral sciences 1 Treffer
- biological neural networks 1 Treffer
- bonding 1 Treffer
24 Treffer
-
In: IEEE Transactions on Electron Devices, Jg. 71 (2024-04-01), Heft 4, S. 2404-2410Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 70 (2023-02-01), Heft 2, S. 461-467Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 71 (2024-05-01), Heft 5, S. 3343-3350Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 71 (2024-04-01), Heft 4, S. 2399-2403Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 70 (2023-04-01), Heft 4, S. 2001-2008Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 70 (2023-02-01), Heft 2, S. 485-492Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-08-01), Heft 8, S. 4254-4258Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-04-01), Heft 4, S. 1698-1705Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-04-01), Heft 4, S. 1736-1742Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-11-01), Heft 11, S. 5598-5605Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-10-01), Heft 10, S. 4944-4950Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-11-01), Heft 11, S. 6376-6383Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-08-01), Heft 8, S. 3813-3818Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-06-01), Heft 6, S. 2686-2692Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 69 (2022-06-01), Heft 6, S. 3100-3104Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021), Heft 1, S. 385-392Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021-11-01), Heft 11, S. 5585-5591Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 67 (2020-04-01), Heft 4, S. 1444-1453Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 68 (2021), Heft 1, S. 109-117Online academicJournalZugriff:
-
In: IEEE Transactions on Electron Devices, Jg. 67 (2020-11-01), Heft 11, S. 4621-4625Online academicJournalZugriff: