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Weniger Treffer
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- complementary metal oxide semiconductors -- usage 11 Treffer
- complementary metal oxide semiconductors -- analysis 6 Treffer
- complementary metal oxide semiconductors -- research 4 Treffer
- complementary metal oxide semiconductors -- structure 4 Treffer
- semiconductor device 3 Treffer
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45 weitere Werte:
- semiconductor industry -- research 3 Treffer
- standard ic 3 Treffer
- complementary metal oxide semiconductors -- design and construction 2 Treffer
- complementary metal oxide semiconductors -- evaluation 2 Treffer
- complementary metal oxide semiconductors -- models 2 Treffer
- integrated circuits -- analysis 2 Treffer
- integrated circuits -- structure 2 Treffer
- semiconductor chips -- analysis 2 Treffer
- semiconductor chips -- structure 2 Treffer
- sensors -- analysis 2 Treffer
- sensors -- structure 2 Treffer
- amplifiers (electronics) -- design and construction 1 Treffer
- amplifiers (electronics) -- models 1 Treffer
- amplifiers (electronics) -- research 1 Treffer
- analog integrated circuits -- models 1 Treffer
- analog to digital converters -- design and construction 1 Treffer
- application-specific integrated circuit 1 Treffer
- application-specific integrated circuits -- analysis 1 Treffer
- array processors -- analysis 1 Treffer
- automatic testing equipment -- usage 1 Treffer
- bus conductors (electricity) -- research 1 Treffer
- calibration -- methods 1 Treffer
- calibration -- usage 1 Treffer
- chemical detectors -- research 1 Treffer
- circuit design -- models 1 Treffer
- color computer graphics -- research 1 Treffer
- colorimetry 1 Treffer
- complementary metal oxide semiconductors -- electric properties 1 Treffer
- custom ic 1 Treffer
- digital signal processor 1 Treffer
- digital-to-analog converters -- research 1 Treffer
- electric measurements -- models 1 Treffer
- electric resistance -- measurement 1 Treffer
- electrodes -- electric properties 1 Treffer
- electronic components industry -- research 1 Treffer
- electronic measurements -- methods 1 Treffer
- electrooptical devices -- design and construction 1 Treffer
- embedded system 1 Treffer
- embedded systems -- design and construction 1 Treffer
- fault location (engineering) -- research 1 Treffer
- field-effect transistors -- usage 1 Treffer
- image processing -- research 1 Treffer
- imaging systems -- research 1 Treffer
- impedance (electricity) -- measurement 1 Treffer
- integrated circuit design 1 Treffer
Sprache
34 Treffer
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 58 (2009-10-01), Heft 10, S. 3653-3658Online academicJournalZugriff:
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Calibration of a high-accuracy 3-D coordinate measurement sensor based on laser beam and CMOS cameraIn: IEEE Transactions on Instrumentation & Measurement, Jg. 58 (2009-09-01), Heft 9, S. 3341-3346Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 58 (2009-08-01), Heft 8, S. 2503-2511Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 58 (2009-06-01), Heft 6, S. 1911-1918Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 58 (2009-05-01), Heft 5, S. 1563-1570Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-12-01), Heft 12, S. 2838-2845Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-12-01), Heft 12, S. 2792-2800Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-11-01), Heft 11, S. 2472-2486Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-08-01), Heft 8, S. 1596-1604Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-08-01), Heft 8, S. 1572-1577Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-07-01), Heft 7, S. 1470-1477Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 57 (2008-04-01), Heft 4, S. 690-698Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 56 (2007-10-01), Heft 5, S. 2043-2050Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 56 (2007-08-01), Heft 4, S. 1231-1238Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 56 (2007-06-01), Heft 3, S. 1064-1073Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 55 (2006-06-01), Heft 3, S. 1017-1020Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 54 (2005-06-01), Heft 3, S. 975-987Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 53 (2004-04-01), Heft 2, S. 238-242Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 53 (2004-02-01), Heft 1, S. 163-169Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 53 (2004-02-01), Heft 1, S. 102-108Online academicJournalZugriff: