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- adaptive control systems 1 Treffer
- adders 1 Treffer
- bandwidths 1 Treffer
- bit rate 1 Treffer
- clock & data recovery circuits 1 Treffer
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45 weitere Werte:
- clock and data recovery (cdr) 1 Treffer
- clocks 1 Treffer
- cmos integrated circuits 1 Treffer
- complementary metal oxide semiconductors 1 Treffer
- current measurement 1 Treffer
- data conversion 1 Treffer
- delays 1 Treffer
- detectors 1 Treffer
- differential amplifiers 1 Treffer
- differential difference amplifier (dda) 1 Treffer
- dynamic range 1 Treffer
- electric oscillators 1 Treffer
- electronic data processing 1 Treffer
- folded cascode 1 Treffer
- frequency measurement 1 Treffer
- gain 1 Treffer
- generators 1 Treffer
- image edge detection 1 Treffer
- multirate 1 Treffer
- oscillators 1 Treffer
- phase change materials 1 Treffer
- phase locked loops 1 Treffer
- phase noise 1 Treffer
- phase-locked loops 1 Treffer
- power demand 1 Treffer
- pulse shrinking 1 Treffer
- quantization (signal) 1 Treffer
- resistors 1 Treffer
- rf test 1 Treffer
- semiconductor device measurement 1 Treffer
- semiconductor technology 1 Treffer
- sensors 1 Treffer
- serial communications 1 Treffer
- signal resolution 1 Treffer
- speed measurements 1 Treffer
- standards 1 Treffer
- system-on-a-chip 1 Treffer
- taiwan semiconductor manufacturing co. ltd. 1 Treffer
- time resolution 1 Treffer
- time-digital conversion 1 Treffer
- time-to-digital converter (tdc) 1 Treffer
- transistors 1 Treffer
- tuning 1 Treffer
- verniers 1 Treffer
- voltage-controlled oscillator (vco) 1 Treffer
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 66 (2017), Heft 1, S. 191-193Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 70 (2021-07-01), S. 1-12Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation & Measurement, Jg. 70 (2021-07-01), S. 1-11Online academicJournalZugriff:
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On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends.In: IEEE Transactions on Instrumentation & Measurement, Jg. 59 (2010-11-01), Heft 11, S. 2870-2876Online academicJournalZugriff: