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Weniger Treffer
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- electronics 12 Treffer
- electronique 12 Treffer
- exact sciences and technology 12 Treffer
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45 weitere Werte:
- sciences exactes et technologie 12 Treffer
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- circuit integre 7 Treffer
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- complementary mos technology 7 Treffer
- integrated circuit 7 Treffer
- technologie mos complementaire 7 Treffer
- tecnologia mos complementario 7 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 5 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 5 Treffer
- circuits electriques, optiques et optoelectroniques 4 Treffer
- circuits integres 4 Treffer
- electric, optical and optoelectronic circuits 4 Treffer
- integrated circuits 4 Treffer
- captador medida 3 Treffer
- capteur mesure 3 Treffer
- circuit properties 3 Treffer
- circuits electroniques 3 Treffer
- electronic circuits 3 Treffer
- experimental result 3 Treffer
- instrumentation 3 Treffer
- measurement sensor 3 Treffer
- performance 3 Treffer
- proprietes des circuits 3 Treffer
- resultado experimental 3 Treffer
- resultat experimental 3 Treffer
- analog circuit 2 Treffer
- business 2 Treffer
- business.industry 2 Treffer
- capteur position 2 Treffer
- capteurs (chimiques, optiques, electriques, de mouvement, de gaz, etc.); teledetection 2 Treffer
- circuit analogique 2 Treffer
- circuit design 2 Treffer
- circuito analogico 2 Treffer
- circuits integres par fonction (dont memoires et processeurs) 2 Treffer
- cmos 2 Treffer
- concepcion circuito 2 Treffer
- concepcion sistema 2 Treffer
- conception circuit 2 Treffer
- conception systeme 2 Treffer
- conception. technologies. analyse fonctionnement. essais 2 Treffer
- defect detection 2 Treffer
- design. technologies. operation analysis. testing 2 Treffer
Sprache
16 Treffer
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In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, Jg. 58 (2009), Heft 5, S. 1563-1570Online KonferenzZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 43 (1994), Heft 3, S. 489-492Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 40 (1991), Heft 4, S. 703-708Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 40 (1991), Heft 3, S. 601-605Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 40 (1991), Heft 4, S. 699-702Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 50 (2001-12-01), Heft 6, S. 1781-1786Online unknownZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 39 (1990), Heft 4, S. 670-671Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 38 (1989), Heft 3, S. 773-778Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, 2012Online unknownZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 46 (1997), Heft 1, S. 18-26Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 46 (1997), Heft 5, S. 1208-1211Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 43 (1994), Heft 6, S. 848-856Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 43 (1994), Heft 4, S. 644-649Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 42 (1993), Heft 4, S. 847-853Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 42 (1993), Heft 3, S. 689-694Online academicJournalZugriff:
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In: IEEE transactions on instrumentation and measurement, Jg. 69 (2020-05-01), Heft 5, S. 1972-1980Online academicJournalZugriff: