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- clocks 3 Treffer
- probes 3 Treffer
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45 weitere Werte:
- calibration 2 Treffer
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- acceleration 1 Treffer
- accelerometer 1 Treffer
- accelerometers 1 Treffer
- active pixel sensor (aps) 1 Treffer
- analog processing circuits 1 Treffer
- analog signal processing (asp) 1 Treffer
- analog-to-digital converter (adc) 1 Treffer
- analysis 1 Treffer
- angle measurement 1 Treffer
- application software 1 Treffer
- application specific processors 1 Treffer
- application-specific integrated circuit (asic) 1 Treffer
- architecture 1 Treffer
- averaging 1 Treffer
- biomedical monitoring 1 Treffer
- broadband communication 1 Treffer
- capacitance measurement 1 Treffer
- capacitance-to-digital converter (cdc) 1 Treffer
- capacitive sensor interface circuit 1 Treffer
- capacitive sensors 1 Treffer
- circuit faults 1 Treffer
- circuit simulation 1 Treffer
- cmos image sensors 1 Treffer
- cmos integrated circuits 1 Treffer
- coil 1 Treffer
- coils 1 Treffer
- correlators 1 Treffer
- cryptography 1 Treffer
- current measurement 1 Treffer
- current sensor 1 Treffer
- dark count rate (dcr) 1 Treffer
- dark current 1 Treffer
- delay lines 1 Treffer
- delay-locked loop (dll) 1 Treffer
- delays 1 Treffer
- detection 1 Treffer
- detectors 1 Treffer
15 Treffer
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-9Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 57 (2008-08-01), Heft 8, S. 1572-1577Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 57 (2008-04-01), Heft 4, S. 690-698Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 72 (2023), S. 1-10Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-12Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 70 (2021), S. 1-12Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 69 (2020-06-01), Heft 6, S. 3928-3935Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-10-01), Heft 10, S. 3514-3523Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-08-01), Heft 8, S. 2871-2879Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 68 (2019-02-01), Heft 2, S. 392-401Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 67 (2018-04-01), Heft 4, S. 745-753Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 55 (2006-12-01), Heft 6, S. 1892-1903Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 57 (2008-02-01), Heft 2, S. 379-385Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 61 (2012-03-01), Heft 3, S. 708-718Online academicJournalZugriff:
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In: IEEE Transactions on Instrumentation and Measurement, Jg. 64 (2015-04-01), Heft 4, S. 840-840Online academicJournalZugriff: