Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 579 Treffer
- detectors 191 Treffer
- radiation effects 171 Treffer
- integrated circuits 143 Treffer
- transistors 128 Treffer
-
45 weitere Werte:
- radiation 122 Treffer
- cmos 110 Treffer
- cmos integrated circuits 97 Treffer
- single event effects 94 Treffer
- digital electronics 92 Treffer
- heavy ions 92 Treffer
- logic circuits 82 Treffer
- ionizing radiation 75 Treffer
- random access memory 75 Treffer
- noise 73 Treffer
- logic gates 72 Treffer
- radiation hardening (electronics) 70 Treffer
- silicon 69 Treffer
- protons 68 Treffer
- cmos technology 67 Treffer
- neutrons 67 Treffer
- irradiation 61 Treffer
- cmos image sensors 52 Treffer
- radiation hardening 52 Treffer
- pixels 51 Treffer
- transient analysis 51 Treffer
- metal oxide semiconductor field-effect transistors 50 Treffer
- application-specific integrated circuits 49 Treffer
- ions 49 Treffer
- semiconductors 49 Treffer
- silicon-on-insulator technology 49 Treffer
- electronic circuits 48 Treffer
- soft errors 48 Treffer
- photodiodes 47 Treffer
- sensitivity 47 Treffer
- image sensors 46 Treffer
- x-rays 45 Treffer
- dark current 44 Treffer
- total ionizing dose (tid) 44 Treffer
- temperature measurement 41 Treffer
- electronic amplifiers 40 Treffer
- single event upset 40 Treffer
- single event upsets 39 Treffer
- electronics 38 Treffer
- mosfet 38 Treffer
- electric potential 36 Treffer
- capacitance 35 Treffer
- clocks 35 Treffer
- layout 35 Treffer
- inverters 33 Treffer
Sprache
Geographischer Bezug
1.152 Treffer
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-07-01), Heft 7, S. 1506-1514Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-07-01), Heft 7, S. 1651-1658Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-09-01), Heft 9, S. 2367-2374Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-03-01), Heft 3, S. 379-383Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1861-1868Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1241-1250Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1284-1292Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1540-1546Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1732-1737Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-07-01), Heft 7, S. 1256-1262Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-06-01), Heft 6, S. 1107-1113Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-07-01), Heft 7, S. 1671-1681Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-06-01), Heft 6, S. 955-959Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-06-01), Heft 6, S. 880-885Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 66 (2019), Heft 1, S. 104-110Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 407-412Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 65 (2018), Heft 1, S. 101-110Online academicJournalZugriff:
-
In: IEEE Transactions on Nuclear Science, Jg. 69 (2022-06-01), Heft 6, S. 1288-1298Online academicJournalZugriff: