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Weniger Treffer
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45 weitere Werte:
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- radiation effects 23 Treffer
- single event effects 22 Treffer
- computer circuits 20 Treffer
- electronic systems 20 Treffer
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- noise 20 Treffer
- nuclear physics 20 Treffer
- logic devices 19 Treffer
- metal oxide semiconductors, complementary 18 Treffer
- business.industry 17 Treffer
- electrical and electronic engineering 17 Treffer
- nuclear and high energy physics 17 Treffer
- nuclear energy and engineering 17 Treffer
- silicon 17 Treffer
- application-specific integrated circuits 16 Treffer
- protons 16 Treffer
- x-rays 16 Treffer
- application specific integrated circuits 15 Treffer
- engineering instruments 15 Treffer
- field programmable gate arrays 15 Treffer
- integrated circuit 15 Treffer
- particles (nuclear physics) 15 Treffer
- random access memory 15 Treffer
- asic 14 Treffer
- clocks 14 Treffer
- electrical engineering 14 Treffer
- front-end electronics 14 Treffer
- total ionizing dose 14 Treffer
- x-ray spectroscopy 14 Treffer
- cmos analog integrated circuits 13 Treffer
- radiation hardening 13 Treffer
- applied sciences 12 Treffer
- electronique 12 Treffer
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347 Treffer
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-12-01), Heft 12, S. 101-110Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-12-01), Heft 12, S. 92-100Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-12-01), Heft 12, S. 84-91Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-12-01), Heft 12, S. 2922-2932Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-09-01), Heft 9, S. 2561-2568Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-09-01), Heft 9, S. 2505-2510Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-08-01), Heft 8, S. 2204-2211Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-08-01), Heft 8, S. 2136-2143Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 66 (2019-02-01), Heft 2, S. 567-574Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-06-01), Heft 6, S. 1599-1604Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017-02-01), Heft 2, S. 789-799Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 477-482Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 245-252Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 204-211Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 45-53Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 38-44Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 27-37Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 64 (2017), Heft 1, S. 654-664Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-12-01), Heft 6, S. 654-664Online academicJournalZugriff:
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In: IEEE Transactions on Nuclear Science, Jg. 63 (2016-08-01), Heft 4, S. 2379-2389Online academicJournalZugriff: