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- OpenAIRE 159 Treffer
- Complementary Index 134 Treffer
- Academic Search Index 131 Treffer
- Applied Science & Technology Source 131 Treffer
- Business Source Ultimate 131 Treffer
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9 weitere Werte:
- Gale General OneFile 117 Treffer
- Gale Academic OneFile 107 Treffer
- PASCAL Archive 101 Treffer
- Science Citation Index Expanded 100 Treffer
- Scopus® 90 Treffer
- British Library Document Supply Centre Inside Serials & Conference Proceedings 77 Treffer
- wiso 63 Treffer
- NARCIS 1 Treffer
- Social Sciences Citation Index 1 Treffer
Art der Quelle
Schlagwort
- complementary metal oxide semiconductors 349 Treffer
- cmos 214 Treffer
- condensed matter physics 159 Treffer
- electrical and electronic engineering 159 Treffer
- electronic, optical and magnetic materials 159 Treffer
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45 weitere Werte:
- industrial and manufacturing engineering 159 Treffer
- integrated circuits 153 Treffer
- business 152 Treffer
- electronics 143 Treffer
- business.industry 137 Treffer
- transistors 112 Treffer
- semiconductors 105 Treffer
- applied sciences 101 Treffer
- electronique 101 Treffer
- exact sciences and technology 101 Treffer
- sciences appliquees 101 Treffer
- sciences exactes et technologie 101 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 98 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 98 Treffer
- silicon 92 Treffer
- engineering 85 Treffer
- complementary mos technology 82 Treffer
- electronic engineering 82 Treffer
- integrated circuit 82 Treffer
- technologie mos complementaire 82 Treffer
- tecnologia mos complementario 82 Treffer
- law 80 Treffer
- law.invention 80 Treffer
- circuits integres 77 Treffer
- conception. technologies. analyse fonctionnement. essais 75 Treffer
- design. technologies. operation analysis. testing 75 Treffer
- hardware_integratedcircuits 69 Treffer
- mosfet 67 Treffer
- materials science 63 Treffer
- logic gates 57 Treffer
- hardware_performanceandreliability 56 Treffer
- semiconductor device measurement 55 Treffer
- semiconductor wafers 54 Treffer
- cmos integrated circuits 53 Treffer
- integrated circuit design 51 Treffer
- optimization 47 Treffer
- optoelectronics 47 Treffer
- electrical engineering 44 Treffer
- digital electronics 42 Treffer
- process variation 42 Treffer
- semiconductor manufacturing 41 Treffer
- circuit design 39 Treffer
- circuit integre 39 Treffer
- metal oxide semiconductor field-effect transistors 39 Treffer
- semiconductor device modeling 39 Treffer
Verlag
Publikation
Sprache
Geographischer Bezug
1.236 Treffer
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 36 (2023-05-01), Heft 2, S. 279-290Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 37 (2024-02-01), Heft 1, S. 93-102Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 36 (2023-11-01), Heft 4, S. 537-542Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 36 (2023-05-01), S. 279-290Online unknownZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 32 (2019), Heft 4, S. 393-399Online serialPeriodicalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 32 (2019), Heft 4, S. 393-399Online serialPeriodicalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 32 (2019), Heft 1, S. 14-22Online serialPeriodicalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 19 (2006), Heft 1, S. 10-18Online KonferenzZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 19 (2006), Heft 1, S. 57-66Online KonferenzZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 25 (2012), Heft 2, S. 255-265Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 25 (2012), Heft 1, S. 26-36Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 19 (2006), Heft 3, S. 331-338Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 26 (2013), Heft 3, S. 393-399Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 24 (2011), Heft 2, S. 273-279Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 36 (2023-11-01), Heft 4, S. 515-519Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 25 (2012), Heft 4, S. 564-570Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 22 (2009), Heft 1, S. 59-65Online academicJournalZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 21 (2008), Heft 2, S. 201-208Online academicJournalZugriff:
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In: IEEE Transactions on Semiconductor Manufacturing, Jg. 32 (2019-11-01), S. 393-399Online unknownZugriff:
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In: IEEE transactions on semiconductor manufacturing, Jg. 16 (2003), Heft 2, S. 319-334Online academicJournalZugriff: