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- complementary metal oxide semiconductors 322 Treffer
- metal oxide semiconductors, complementary 292 Treffer
- transistors 234 Treffer
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45 weitere Werte:
- cmos integrated circuits 198 Treffer
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- very large scale integration 157 Treffer
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- capacitors 134 Treffer
- logic circuits 133 Treffer
- switches 129 Treffer
- digital electronics 101 Treffer
- random access memory 95 Treffer
- hardware 87 Treffer
- calibration 86 Treffer
- power demand 86 Treffer
- electric potential 79 Treffer
- analog-to-digital converters 75 Treffer
- capacitance 75 Treffer
- microprocessors 75 Treffer
- threshold voltage 72 Treffer
- low power 69 Treffer
- cmos 68 Treffer
- voltage control 68 Treffer
- noise 62 Treffer
- integrated circuit interconnections 61 Treffer
- bandwidth 59 Treffer
- systems on a chip 59 Treffer
- detectors 58 Treffer
- delay lines 57 Treffer
- voltage-controlled oscillators 57 Treffer
- delay 54 Treffer
- jitter 54 Treffer
- integrated circuit modeling 53 Treffer
- inverters 53 Treffer
- algorithms 52 Treffer
- radio frequency 51 Treffer
- bandwidths 50 Treffer
- gain 49 Treffer
- power resources 48 Treffer
- switching circuits 48 Treffer
- electronic circuit design 46 Treffer
- electronic circuits 46 Treffer
- low voltage integrated circuits 45 Treffer
- generators 44 Treffer
- decoding 43 Treffer
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1.382 Treffer
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-09-01), Heft 9, S. 1294-1305Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-07-01), Heft 7, S. 1527-1536Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-10-01), Heft 10, S. 1533-1537Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-10-01), Heft 10, S. 1373-1380Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 28 (2020-12-01), Heft 12, S. 2518-2529Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-02-01), Heft 2, S. 294-303Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-11-01), Heft 11, S. 2470-2482Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-11-01), Heft 11, S. 1739-1747Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-09-01), Heft 9, S. 2899-2910Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 29 (2021-09-01), Heft 9, S. 1665-1669Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-11-01), Heft 11, S. 3334-3344Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-07-01), Heft 7, S. 905-914Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018), Heft 1, S. 23-36Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-09-01), Heft 9, S. 1808-1813Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-06-01), Heft 6, S. 694-705Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-05-01), Heft 5, S. 634-643Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 28 (2020-10-01), Heft 10, S. 2089-2098Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-03-01), Heft 3, S. 1118-1125Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 28 (2020-09-01), Heft 9, S. 2079-2083Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 28 (2020-04-01), Heft 4, S. 1094-1098Online academicJournalZugriff: