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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-02-01), Heft 2, S. 294-303Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 30 (2022-07-01), Heft 7, S. 905-914Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-11-01), Heft 11, S. 3334-3344Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 23 (2015-02-01), Heft 2, S. 356-368Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 29 (2021-09-01), Heft 9, S. 1665-1669Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 28 (2020-04-01), Heft 4, S. 1094-1098Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-11-01), Heft 11, S. 2575-2586Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-09-01), Heft 9, S. 2088-2095Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019-04-01), Heft 4, S. 830-842Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 27 (2019), Heft 1, S. 248-252Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-11-01), Heft 11, S. 2279-2289Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-11-01), Heft 11, S. 2290-2298Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-10-01), Heft 10, S. 1980-1988Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-08-01), Heft 8, S. 1554-1564Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-07-01), Heft 7, S. 1403-1407Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 26 (2018-06-01), Heft 6, S. 1192-1203Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 25 (2017-12-01), Heft 12, S. 3444-3454Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 25 (2017-12-01), Heft 12, S. 3434-3443Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 25 (2017-12-01), Heft 12, S. 3369-3379Online academicJournalZugriff:
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A Two-Step Analog Accumulator for CMOS TDI Image Sensor With Temporal Undersampling Exposure Method.In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 24 (2016-03-01), Heft 3, S. 1104-1117Online academicJournalZugriff: