Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- very-large-scale integration 12 Treffer
- cmos 10 Treffer
- semiconductor industry 10 Treffer
- complementary metal oxide semiconductors 9 Treffer
- very-large-scale integration -- analysis 5 Treffer
-
45 weitere Werte:
- algorithm 4 Treffer
- analog to digital converters 3 Treffer
- complementary metal oxide semiconductors -- analysis 3 Treffer
- sub-threshold 3 Treffer
- algorithms 2 Treffer
- engineering schools 2 Treffer
- image processing 2 Treffer
- knowledge-based system 2 Treffer
- low power 2 Treffer
- semiconductor industry -- analysis 2 Treffer
- sensors 2 Treffer
- sram 2 Treffer
- transistors 2 Treffer
- ultra-low power 2 Treffer
- write margin 2 Treffer
- 00-01 1 Treffer
- 65 nm 1 Treffer
- 65 nm cmos 1 Treffer
- active filters 1 Treffer
- active inductor 1 Treffer
- active inductors 1 Treffer
- algorithms -- analysis 1 Treffer
- algorithms -- safety and security measures 1 Treffer
- amplifiers (electronics) 1 Treffer
- analog circuits 1 Treffer
- analog comparator 1 Treffer
- analogue multiplier 1 Treffer
- analytical models 1 Treffer
- asic 1 Treffer
- automation -- analysis 1 Treffer
- automation -- technology application 1 Treffer
- capacitors 1 Treffer
- causal reasoning 1 Treffer
- ccii- 1 Treffer
- cdma technology 1 Treffer
- chemical reactions -- analysis 1 Treffer
- circuit components -- energy use 1 Treffer
- circuit design 1 Treffer
- circuit designer 1 Treffer
- cmos analog integrated circuit 1 Treffer
- cmos lnas 1 Treffer
- cmos logic 1 Treffer
- cmos logic circuits 1 Treffer
- cmos op-amp 1 Treffer
- code division multiple access technology 1 Treffer
Sprache
132 Treffer
-
In: Integration, the VLSI Journal, Jg. 60 (2018), S. 48-55academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 60 (2018), S. 25-38academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 60 (2018), S. 63-73academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 60 (2018), S. 56-62academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 10-22academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 243-246academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 59 (2017-09-01), S. 206-217academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 57 (2017-03-01), S. 1-10academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 56 (2017), S. 70-76academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 254-264academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 330-340academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 194-201academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 55 (2016-09-01), S. 57-66academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 52 (2016), S. 122-128academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 52 (2016), S. 228-236academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 52 (2016), S. 253-259academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 52 (2016), S. 195-207academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 52 (2016), S. 217-227academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 50 (2015-06-01), S. 28-38academicJournalZugriff:
-
In: Integration, the VLSI Journal, Jg. 50 (2015-06-01), S. 16-27academicJournalZugriff: