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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, S. 499-504KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, S. 505-509KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, S. 349-353KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2003, S. 99-104KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2003, S. 40-44KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2002, S. 771-776KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2002, S. 387-390KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2002, S. 317-324KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2002, S. 169-172KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2001, S. 373-380KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2001, S. 305-312KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2001, S. 237-242KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2001, S. 109-114KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2000, S. 141-146KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 1999, S. 359-364KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 1999, S. 427-438KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 1999, S. 239-246KonferenzZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, Jg. CONF 39 (2013), S. 420-423serialPeriodicalZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, Jg. CONF 39 (2013), S. 361-368serialPeriodicalZugriff:
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In: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, Jg. CONF 39 (2013), S. 336-340serialPeriodicalZugriff: