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In: Journal of Electronic Testing, Jg. 35 (2019-12-01), S. 797-808Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 36 (2020-07-09), S. 461-467Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 32 (2016-04-29), S. 385-391Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 24 (2008-01-10), S. 157-163Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 6 (1995-02-01), S. 127-131Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 34 (2018-02-01), S. 27-41Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 32 (2016-03-16), S. 163-173Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 32 (2016-02-27), S. 137-145Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 31 (2015-08-01), S. 395-401Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 29 (2013-06-11), S. 537-544Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 11 (1997), S. 147-156Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 15 (1999), S. 53-62Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 34 (2018-07-21), S. 405-415Online unknownZugriff:
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In: Journal of Electronic Testing, Jg. 33 (2017-12-01), S. 769-773Online unknownZugriff: