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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- depot chimique phase vapeur 15 Treffer
- chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) 14 Treffer
- depot chimique en phase vapeur (incluant le cvd active par plasma, mocvd, etc.) 14 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 8 Treffer
- couche mince 8 Treffer
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45 weitere Werte:
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 8 Treffer
- thin films 8 Treffer
- amorphous hydrogenated material 6 Treffer
- condensed matter: structure, mechanical and thermal properties 6 Treffer
- croissance film 6 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 6 Treffer
- film growth 6 Treffer
- materiau amorphe hydrogene 6 Treffer
- bande interdite 5 Treffer
- c si 5 Treffer
- energy gap 5 Treffer
- silicium carbure 5 Treffer
- silicon carbides 5 Treffer
- structure et morphologie de couches minces 5 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 5 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 5 Treffer
- thin film structure and morphology 5 Treffer
- addition bore 4 Treffer
- amorphous semiconductors; glasses 4 Treffer
- amorphous state 4 Treffer
- boron additions 4 Treffer
- conductivite electrique 4 Treffer
- electrical conductivity 4 Treffer
- etat amorphe 4 Treffer
- fabrication property relation 4 Treffer
- infrared spectra 4 Treffer
- metal transition compose 4 Treffer
- nanocristal 4 Treffer
- nanocrystal 4 Treffer
- o si 4 Treffer
- optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation 4 Treffer
- proprietes optiques, spectroscopie et autres interactions de la matiere condensee avec les particules et le rayonnement 4 Treffer
- relacion fabricacion propiedad 4 Treffer
- relation fabrication propriete 4 Treffer
- silicium oxyde 4 Treffer
- silicon oxides 4 Treffer
- spectre ir 4 Treffer
- transition element compounds 4 Treffer
- absorption spectra 3 Treffer
- activation energy 3 Treffer
- a-sic:h 3 Treffer
- binary compounds 3 Treffer
- chemical composition 3 Treffer
- chemical preparation 3 Treffer
- compose binaire 3 Treffer
Publikation
- amorphous and microcrystalline semiconductors - science and technology 2 Treffer
- high-k gate dielectrics: proceedings of the e-mrs 2001 spring meeting, symposium q, strasbourg, france, 5-8 june 2001 2 Treffer
- proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (icams 19), nice, france, august 27-31, 2001. part b 2 Treffer
Sprache
18 Treffer
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In: Proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (ICAMS 19), Nice, France, August 27-31, 2001. Part B, Jg. 299302 (2002), S. 896-901KonferenzZugriff:
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In: Proceedings of the 19th international conference on amorphous and microcrystalline semiconductors - science and technology (ICAMS 19), Nice, France, August 27-31, 2001. Part B, Jg. 299302 (2002), S. 880-884KonferenzZugriff:
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In: Journal of non-crystalline solids, Jg. 351 (2005), Heft 1, S. 89-92academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 298 (2002), Heft 2-3, S. 131-136academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 260 (1999), Heft 3, S. 188-194academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 211 (1997), Heft 1-2, S. 173-179academicJournalZugriff:
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In: High-k Gate Dielectrics: Proceedings of the E-MRS 2001 Spring Meeting, Symposium Q, Strasbourg, France, 5-8 June, Jg. 303 (2002), Heft 1, S. 134-138KonferenzZugriff:
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In: Journal of non-crystalline solids, Jg. 337 (2004), Heft 2, S. 115-120academicJournalZugriff:
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In: High-k Gate Dielectrics: Proceedings of the E-MRS 2001 Spring Meeting, Symposium Q, Strasbourg, France, 5-8 June, Jg. 303 (2002), Heft 1, S. 29-34KonferenzZugriff:
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In: Amorphous and Microcrystalline Semiconductors - Science and Technology, Jg. 266-69 (2000), S. 680-684KonferenzZugriff:
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In: Amorphous and Microcrystalline Semiconductors - Science and Technology, Jg. 266-69 (2000), S. 689-693KonferenzZugriff:
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In: Journal of non-crystalline solids, Jg. 324 (2003), Heft 1-2, S. 159-171academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 272 (2000), Heft 2-3, S. 163-173academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 226 (1998), Heft 1-2, S. 58-66academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 195 (1996), Heft 1-2, S. 176-179academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 169 (1994), Heft 3, S. 301-305academicJournalZugriff:
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In: Journal of non-crystalline solids, Jg. 311 (2002), Heft 2, S. 130-137academicJournalZugriff:
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Structural analysis of amorphous hydrogenated silicon-carbon thin films from silane/propane mixturesIn: Journal of non-crystalline solids, Jg. 175 (1994), Heft 2-3, S. 195-203academicJournalZugriff: