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Weniger Treffer
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Schlagwort
- epitaxie phase liquide 16 Treffer
- lpe 16 Treffer
- compose mineral 13 Treffer
- inorganic compounds 13 Treffer
- semiconductor materials 13 Treffer
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45 weitere Werte:
- cross-disciplinary physics: materials science; rheology 11 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 11 Treffer
- materials science 11 Treffer
- science des materiaux 11 Treffer
- couche mince 9 Treffer
- materiau semiconducteur 9 Treffer
- methodes de depot de films et de revetements; croissance de films et epitaxie 9 Treffer
- methods of deposition of films and coatings; film growth and epitaxy 9 Treffer
- epitaxie en phase liquide; depot en phase liquide (phases fondues, solutions et couches superficielles sur des liquides) 8 Treffer
- liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids) 8 Treffer
- photoluminescence 8 Treffer
- thin films 8 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 7 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 7 Treffer
- gallium arsenides 6 Treffer
- gallium arseniure 6 Treffer
- in p 6 Treffer
- indium phosphure 6 Treffer
- compose binaire 5 Treffer
- condensed matter: structure, mechanical and thermal properties 5 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 5 Treffer
- iii-v semiconductors 5 Treffer
- indium phosphides 5 Treffer
- optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation 5 Treffer
- proprietes optiques, spectroscopie et autres interactions de la matiere condensee avec les particules et le rayonnement 5 Treffer
- semiconducteurs iii-v 5 Treffer
- binary compounds 4 Treffer
- caracteristique capacite tension 4 Treffer
- compose quaternaire 4 Treffer
- cv characteristic 4 Treffer
- indium arsenides 4 Treffer
- indium arseniure 4 Treffer
- inp 4 Treffer
- semiconducteur 4 Treffer
- croissance cristalline 3 Treffer
- crystal growth 3 Treffer
- defauts et impuretes dans les cristaux; microstructure 3 Treffer
- defects and impurities in crystals; microstructure 3 Treffer
- doped materials 3 Treffer
- effet concentration 3 Treffer
- effet hall 3 Treffer
- electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures 3 Treffer
- epitaxie 3 Treffer
- epitaxy 3 Treffer
- hall effect 3 Treffer
Publikation
- containing papers presented at the ninth international conference on defects: recognition, imaging and physics in semiconductors (drip-ix), rimini, italy, 24-28th september 2001 4 Treffer
- fourth international workshop on expert evaluation and control of semiconductor materials and technologies, june 22-24, 1998, cardiff, wales 4 Treffer
- 5th international workshop on expert evaluation and control of compound semiconductor materials and technologies (exmatec 2000), may 21-24, 2000, heraklion, crete, greece 2 Treffer
- 2nd european conference on silicon carbide and related materials, september 2-4, 1998, montpellier, france 1 Treffer
- containing papers presented at the international conference on advanced materials 1999, symposium m: silicon-based materials and devices, june 13-18, 1999, beijing, china 1 Treffer
- Ein weiterer Wert:
Sprache
21 Treffer
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In: 2nd European Conference on Silicon Carbide and Related Materials, September 2-4, 1998, Montpellier, France, Jg. 61-62 (1999), S. 296-300Online KonferenzZugriff:
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In: Fourth International Workshop on Expert Evaluation and Control of Semiconductor Materials and Technologies, June 22-24, 1998, Cardiff, Wales, Jg. 66 (1999), Heft 1-3, S. 67-69Online KonferenzZugriff:
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In: Containing papers presented at the Ninth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001, Jg. 91-92 (2002), S. 491-494KonferenzZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 42 (1996), Heft 1-3, S. 153-156Online academicJournalZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 22 (1994), Heft 2-3, S. 227-232academicJournalZugriff:
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In: 5th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC 2000), May 21-24, Jg. 80 (2001), Heft 1-3, S. 337-341KonferenzZugriff:
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In: Fourth International Workshop on Expert Evaluation and Control of Semiconductor Materials and Technologies, June 22-24, 1998, Cardiff, Wales, Jg. 66 (1999), Heft 1-3, S. 63-66Online KonferenzZugriff:
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In: 5th International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC 2000), May 21-24, Jg. 80 (2001), Heft 1-3, S. 345-347KonferenzZugriff:
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In: Containing papers presented at the Ninth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001, Jg. 91-92 (2002), S. 38-42KonferenzZugriff:
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In: Containing papers presented at the Ninth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001, Jg. 91-92 (2002), S. 83-86KonferenzZugriff:
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In: Containing papers presented at the International Conference on Advanced Materials 1999, Symposium M: Silicon-based Materials and Devices, June 13-18, Jg. 72 (2000), Heft 2-3, S. 173-176Online KonferenzZugriff:
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In: Fourth International Workshop on Expert Evaluation and Control of Semiconductor Materials and Technologies, June 22-24, 1998, Cardiff, Wales, Jg. 66 (1999), Heft 1-3, S. 75-78Online KonferenzZugriff:
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In: Containing papers presented at the Ninth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001, Jg. 91-92 (2002), S. 407-411KonferenzZugriff:
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In: European Materials Research Society 1999 Spring Meeting, Symposium I: Microcrystalline and Nanocrystalline Semiconductors, June 1-4, Jg. 69-70 (2000), S. 500-504Online KonferenzZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 60 (1999), Heft 3, S. 212-216Online academicJournalZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 58 (1999), Heft 3, S. 229-233Online academicJournalZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 38 (1996), Heft 1-2, S. 186-193Online academicJournalZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 64 (1999), Heft 3, S. 161-169Online academicJournalZugriff:
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In: Materials science & engineering. B, Solid-state materials for advanced technology, Jg. 40 (1996), Heft 1, S. 63-66Online academicJournalZugriff:
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In: Fourth International Workshop on Expert Evaluation and Control of Semiconductor Materials and Technologies, June 22-24, 1998, Cardiff, Wales, Jg. 66 (1999), Heft 1-3, S. 58-62Online KonferenzZugriff: