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- atomic force microscopy -- analysis 2 Treffer
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19 weitere Werte:
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- industrial equipment and supplies industry -- analysis 1 Treffer
- industrial equipment and supplies industry -- electric properties 1 Treffer
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- thin films -- electric properties 1 Treffer
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In: Materials Science in Semiconductor Processing, Jg. 11 (2008-10-01), Heft 5, S. 271-278academicJournalZugriff:
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In: Materials Science in Semiconductor Processing, Jg. 8 (2005-02-01), Heft 1-3, S. 203-207academicJournalZugriff:
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In: Materials Science in Semiconductor Processing, Jg. 11 (2008-10-01), Heft 5, S. 250-253academicJournalZugriff:
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In: Materials Science in Semiconductor Processing, Jg. 8 (2005-02-01), Heft 1-3, S. 327-336academicJournalZugriff: