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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- complementary mos technology 164 Treffer
- technologie mos complementaire 164 Treffer
- tecnologia mos complementario 164 Treffer
- transistors 59 Treffer
- fiabilidad 56 Treffer
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45 weitere Werte:
- fiabilite 56 Treffer
- reliability 56 Treffer
- circuits electriques, optiques et optoelectroniques 55 Treffer
- electric, optical and optoelectronic circuits 55 Treffer
- circuit integre 51 Treffer
- circuito integrado 51 Treffer
- integrated circuit 51 Treffer
- evaluation performance 49 Treffer
- performance evaluation 49 Treffer
- circuit properties 48 Treffer
- evaluacion prestacion 48 Treffer
- proprietes des circuits 48 Treffer
- circuits electroniques 47 Treffer
- electronic circuits 47 Treffer
- deterioracion 42 Treffer
- damaging 41 Treffer
- endommagement 41 Treffer
- appareillage electronique et fabrication. composants passifs, circuits imprimes, connectique 40 Treffer
- electronic equipment and fabrication. passive components, printed wiring boards, connectics 40 Treffer
- electrostatic discharge 36 Treffer
- decharge electrostatique 35 Treffer
- mosfet 34 Treffer
- transistor mosfet 34 Treffer
- circuit integre cmos 26 Treffer
- cmos integrated circuits 26 Treffer
- grille transistor 25 Treffer
- rejilla transistor 25 Treffer
- transistor gate 25 Treffer
- dispositif protection 23 Treffer
- dispositivo proteccion 23 Treffer
- protective device 23 Treffer
- corriente escape 22 Treffer
- courant fuite 22 Treffer
- leakage current 22 Treffer
- defaillance 21 Treffer
- essais, mesure, bruit et fiabilite 21 Treffer
- failures 21 Treffer
- fallo 21 Treffer
- testing, measurement, noise and reliability 21 Treffer
- nmos technology 20 Treffer
- technologie nmos 20 Treffer
- tecnologia nmos 20 Treffer
- robustesse 19 Treffer
- robustez 19 Treffer
- robustness 19 Treffer
Publikation
- reliability of electron devices, failure physics and analysis 10 Treffer
- 16th european symposium on reliability of electron devices, failure physics and analysis (esref 2005), arcachon, france, october 10-14, 2005 7 Treffer
- 17th european symposium on reliability of electron devices, failure physics and analysis (esref 2006), wuppertal, germany, 3-6 october 2006 7 Treffer
- 14th workshop on dielectrics in microelectronics (wodim 2006) 5 Treffer
- 2009 international electron devices and materials symposium (iedms) 5 Treffer
- 4 weitere Werte:
Sprache
Geographischer Bezug
185 Treffer
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 90-99academicJournalZugriff:
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In: 14TH Workshop on dielectrics in microelectronics (WoDiM 2006), Jg. 47 (2007), Heft 4-5, S. 739-742KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 702-712KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 3, S. 349-355academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 53 (2013), Heft 4, S. 592-599academicJournalZugriff:
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In: Reliability of electron devices, failure physics and analysis, Jg. 44 (2004), Heft 9-11, S. 1519-1522KonferenzZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 12, S. 2357-2365academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 51 (2011), Heft 5, S. 871-878academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 50 (2010), Heft 8, S. 1054-1061academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 5-6, S. 949-958academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 2-4, S. 301-310academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 8, S. 1326-1334academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 48 (2008), Heft 7, S. 995-999academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 45 (2005), Heft 3-4, S. 499-506academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 45 (2005), Heft 2, S. 255-268academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 49 (2009), Heft 8, S. 885-891academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 46 (2006), Heft 7, S. 1042-1049academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 48 (2008), Heft 1, S. 29-36academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 1, S. 110-118academicJournalZugriff:
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In: Microelectronics and reliability, Jg. 54 (2014), Heft 2, S. 397-403academicJournalZugriff: