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In: Microelectronics Reliability, Jg. 85 (2018-06-01), S. 140-147Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 112 (2020-09-01), S. 113750-113750Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-09-01), S. 1382-1385Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 46 (2006-05-01), S. 702-712Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 91 (2018-12-01), S. 31-37Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 128 (2022), S. 114427-114427Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 127 (2021-12-01), S. 114396-114396Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 83 (2018-04-01), S. 271-280Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 82 (2018-03-01), S. 228-234Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 66 (2016-11-01), S. 32-37Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 60 (2016-05-01), S. 41-47Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-07-01), S. 1174-1179Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 55 (2015-02-01), S. 508-513Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-12-01), S. 2137-2142Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 50 (2010-06-01), S. 831-838Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 49 (2009-12-01), S. 1440-1446Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 46 (2006-02-01), S. 201-212Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 45 (2005-02-01), S. 255-268Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 44 (2004-05-01), S. 877-883Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 41 (2001-08-01), S. 1115-1122Online unknownZugriff: