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In: Microelectronics Reliability, Jg. 51 (2011-09-01), Heft 9-11, S. 1701-1704academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-09-01), Heft 9-11, S. 1646-1651academicJournalZugriff:
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In: Microelectronics Reliability, Jg. 51 (2011-09-01), S. 1646-1651Online unknownZugriff: