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In: MICROELECTRONICS RELIABILITY, Jg. 45 (2005), Heft 9/11, S. 1738-1741KonferenzZugriff:
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Non-destructive Testing Technique for MOSFET’s Characterisation during Soft-Switching ZVS OperationsIn: Microelectronics Reliability, Jg. 45 (2005-09-01), S. 1738-1741Online unknownZugriff:
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In: Microelectronics Reliability, Jg. 145 (2023-06-01), S. N.PAGacademicJournalZugriff: