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In: Secondary ion mass spectrometry SIMS XIV: Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics, San Diego, California, USA, September 14-19, 2003, Jg. 231-32 (2004), S. 113-116KonferenzZugriff:
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In: Secondary ion mass spectrometry SIMS XIV: Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics, San Diego, California, USA, September 14-19, 2003, Jg. 231-32 (2004), S. 54-58KonferenzZugriff:
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In: Secondary ion mass spectrometry SIMS XIV: Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics, San Diego, California, USA, September 14-19, 2003, Jg. 231-32 (2004), S. 106-112KonferenzZugriff: