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Weniger Treffer
Gefunden in
Schlagwort
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 482 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 482 Treffer
- complementary mos technology 455 Treffer
- technologie mos complementaire 455 Treffer
- tecnologia mos complementario 455 Treffer
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45 weitere Werte:
- integrated circuits 264 Treffer
- circuits integres 259 Treffer
- conception. technologies. analyse fonctionnement. essais 221 Treffer
- design. technologies. operation analysis. testing 221 Treffer
- circuits electriques, optiques et optoelectroniques 179 Treffer
- electric, optical and optoelectronic circuits 179 Treffer
- circuit properties 173 Treffer
- proprietes des circuits 173 Treffer
- circuit integre 152 Treffer
- circuito integrado 144 Treffer
- integrated circuit 144 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 132 Treffer
- microelectronic fabrication (materials and surfaces technology) 132 Treffer
- evaluation performance 120 Treffer
- metrologie et instrumentation 120 Treffer
- metrology and instrumentation 120 Treffer
- performance evaluation 120 Treffer
- general 118 Treffer
- generalites 118 Treffer
- captador medida 111 Treffer
- capteur mesure 111 Treffer
- evaluacion prestacion 111 Treffer
- measurement sensor 111 Treffer
- instruments, apparatus, components and techniques common to several branches of physics and astronomy 110 Treffer
- instruments, appareillage, composants et techniques communs a plusieurs branches de la physique et de l'astronomie 110 Treffer
- circuits optiques et optoelectroniques 105 Treffer
- optical and optoelectronic circuits 105 Treffer
- etude experimentale 102 Treffer
- experimental study 102 Treffer
- dispositifs a images 101 Treffer
- imaging devices 101 Treffer
- fabricacion microelectrica 89 Treffer
- fabrication microelectronique 89 Treffer
- microelectronic fabrication 89 Treffer
- optoelectronic devices 88 Treffer
- dispositifs optoelectroniques 87 Treffer
- experimental result 79 Treffer
- resultado experimental 79 Treffer
- resultat experimental 79 Treffer
- detecteur image 75 Treffer
- estudio experimental 75 Treffer
- detector imagen 74 Treffer
- genie mecanique 74 Treffer
- image sensor 74 Treffer
- mechanical engineering 74 Treffer
Verlag
Publikation
- microelectronic device technology ii (santa clara ca, 23-24 september 1998) 20 Treffer
- sensors and camera systems for scientific, industrial, and digital photography applications v (san jose ca, 19-21 january 2004) 20 Treffer
- vlsi circuits and systems (maspalomas, 19-21 may 2003) 17 Treffer
- advanced focal plane arrays and electronic cameras ii (zurich, 18-19 may 1998) 14 Treffer
- microelectronic device technology iii (santa clara ca, 22-23 september 1999) 13 Treffer
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45 weitere Werte:
- microelectronics : design, technology, and packaging (perth, 10-12 december 2003) 13 Treffer
- sensors and camera systems for scientific, industrial, and digital photography applications iii (san jose ca, 21-23 january 2002) 13 Treffer
- detectors and associated signal processing (saint etienne, 1-2 october 2003) 12 Treffer
- physics of semiconductor devices (delhi, 11-15 december 2001) 11 Treffer
- design, test, integration, and packaging of mems/moems (paris, 9-11 mai 2000) 10 Treffer
- design, test, integration, and packaging of mems/moems 2002 (cannes, 6-8 may 2002) 10 Treffer
- sensors, cameras, and systems for scientific/industrial applications (san jose ca, 25-26 january 1999) 10 Treffer
- smart electronics and mems (san diego ca, 2-4 march 1998) 10 Treffer
- high-speed photography and photonics (alexandria va, 20-24 september 2004) 9 Treffer
- smart structures, devices, and systems ii (sydney, 13-15 december 2004) 9 Treffer
- design, test, and microfabrication of mems and moems (paris, 30 march - 1 april 1999) 8 Treffer
- physics of semiconductor devices (delhi, 14-18 december 1999) 8 Treffer
- smart electronics, mems, biomems, and nanotechnology (san diego ca, 15-18 march 2004) 8 Treffer
- design, characterization, and packaging for mems and microelectronics (royal pines resort, 27-29 october 1999) 7 Treffer
- electronics and structures for mems (royal pines resort, 27-29 october 1999) 7 Treffer
- smart sensors, actuators, and mems ii (9-11 may 2005, seville, spain) 7 Treffer
- analytical and diagnostic techniques for semiconductor materials, devices, and processes (leuven, 13-15 september 1999) 6 Treffer
- design, test, integration, and packaging of mems/moems (cannes, 25-27 april 2001) 6 Treffer
- digital photography (san jose ca, 17-18 january 2005) 6 Treffer
- infrared readout electronics iv (orlando fl, 13 april 1998) 6 Treffer
- in-line methods and monitors for process and yield improvement (santa clara ca, 22-23 september 1999) 6 Treffer
- metrology, inspection, and process control for microlithography xvi (santa clara ca, 4-7 march 2002) 6 Treffer
- optoelectronic interconnects vi (san jose ca, 27-29 january 1999) 6 Treffer
- semiconductor photodetectors ii (san jose ca, 25-26 january 2005) 6 Treffer
- advances in microelectronic device technology (nanjing, 7-9 november 2001) 5 Treffer
- electronics and structures for mems ii (adelaide, 17-19 december 2001) 5 Treffer
- micro- and nano-optics for optical interconnection and information processing (san diego ca, 29-31 july 2001) 5 Treffer
- micromachined devices and components iv (santa clara ca, 21-22 september 1998) 5 Treffer
- noise in devices and circuits ii (maspalomas, 26-28 may 2004) 5 Treffer
- optoelectronic interconnects viii (san jose ca, 25-26 january 2001) 5 Treffer
- smart imagers and their application : 6-8 october 2004, moscow, russia 5 Treffer
- design and process integration for microelectronic manufacturing ii (santa clara ca, 26-28 february 2003) 4 Treffer
- design, characterization, and packaging for mems and microelectronics ii (adelaide, 17-19 december 2001) 4 Treffer
- mems, moems, and micromachining (strasbourg, 29-30 april 2004) 4 Treffer
- metrology, inspection, and process control for microlithography xiv (santa clara ca, 28 february - 2 march 2000) 4 Treffer
- metrology, inspection, and process control for microlithography xix (san jose ca, 7-10 march 2005) 4 Treffer
- microelectronic manufacturing yield, reliability, and failure analysis iv (santa clara ca, 23-24 september 1998) 4 Treffer
- microelectronics (baltimore md, 9-11 october 2001) 4 Treffer
- optoelectronic integrated circuits and packaging iii (san jose ca, 28-29 january 1999) 4 Treffer
- optoelectronic integrated circuits iv (san jose ca, 26-27 january 2000) 4 Treffer
- optoelectronic integrated circuits vi (san jose ca, 26 january 2004) 4 Treffer
- optoelectronic integration on silicon ii (san jose ca, 25-26 january 2005) 4 Treffer
- photodetectors : materials and devices vi (san jose ca, 22-24 january 2001) 4 Treffer
- photonics in the automobile (geneva, 29 november - 1 december 2004) 4 Treffer
- photonics packaging and integration iii (san jose ca, 28-30 january 2003) 4 Treffer
Sprache
Geographischer Bezug
687 Treffer
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In: Photonics in the automobile (Geneva, 29 November - 1 December 2004), 2005, S. 86-93KonferenzZugriff:
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Post-CMOS chip-level processing for high-aspect-ratio microprobe fabrication utilizing pulse platingIn: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 7-10 March 2005), 2005, S. 1-10KonferenzZugriff:
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In: Optoelectronic integration on silicon II (San Jose CA, 25-26 January 2005), 2005, S. 59-72KonferenzZugriff:
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In: Digital photography (San Jose CA, 17-18 January 2005), 2005, S. 85-95KonferenzZugriff:
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In: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 7-10 March 2005), 2005, S. 11-19KonferenzZugriff:
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In: High-speed photography and photonics (Alexandria VA, 20-24 September 2004), 2005, S. 293-300KonferenzZugriff:
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In: High-speed photography and photonics (Alexandria VA, 20-24 September 2004), 2005, S. 778-789KonferenzZugriff:
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In: Digital photography (San Jose CA, 17-18 January 2005), 2005, S. 25-33KonferenzZugriff:
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In: Detectors and associated signal processing (Saint Etienne, 1-2 October 2003), 2004, S. 208-216KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 294-302KonferenzZugriff:
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In: Semiconductor photodetectors (San Jose CA, 28-29 January 2004), 2004, S. 20-28KonferenzZugriff:
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In: Microelectronics : design, technology, and packaging (Perth, 10-12 December 2003), 2004, S. 194-205KonferenzZugriff:
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In: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 15-18 March 2004), 2004, S. 20-25KonferenzZugriff:
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In: Smart electronics, MEMS, bioMEMS, and nanotechnology (San Diego CA, 15-18 March 2004), 2004, S. 1-12KonferenzZugriff:
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In: Microwave and optical technology 2003 (Ostrava, 11-15 August 2003), 2004, S. 516-522KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 34-41KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 193-204KonferenzZugriff:
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In: Detectors and associated signal processing (Saint Etienne, 1-2 October 2003), 2004, S. 178-186KonferenzZugriff:
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In: Sensors and camera systems for scientific, industrial, 2004, S. 175-185KonferenzZugriff:
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In: Integrated optics and photonic integrated circuits (Strasbourg, 27-29 April 2004), 2004, S. 434-440KonferenzZugriff: