Suchergebnisse
UB Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- applied sciences 10 Treffer
- sciences appliquees 10 Treffer
- genie mecanique 6 Treffer
- mechanical engineering 6 Treffer
- electronique des semiconducteurs. microelectronique. optoelectronique. dispositifs a l'etat solide 4 Treffer
-
45 weitere Werte:
- etude experimentale 4 Treffer
- experimental study 4 Treffer
- semiconductor electronics. microelectronics. optoelectronics. solid state devices 4 Treffer
- cross-disciplinary physics: materials science; rheology 3 Treffer
- domaines interdisciplinaires: science des materiaux; rheologie 3 Treffer
- essai non destructif 3 Treffer
- fabricacion microelectrica 3 Treffer
- fabrication microelectronique 3 Treffer
- fabrication microelectronique (technologie des materiaux et des surfaces) 3 Treffer
- general 3 Treffer
- generalites 3 Treffer
- materials science 3 Treffer
- microelectronic fabrication 3 Treffer
- microelectronic fabrication (materials and surfaces technology) 3 Treffer
- modeling 3 Treffer
- modelisation 3 Treffer
- modelizacion 3 Treffer
- science des materiaux 3 Treffer
- bruit 2 Treffer
- dispositif microelectromecanique 2 Treffer
- dispositifs micro- et nanoelectromecaniques (mems/nems) 2 Treffer
- dispositivo microelectromecanico 2 Treffer
- domaines classiques de la physique (y compris les applications) 2 Treffer
- essais sur les materiaux 2 Treffer
- estudio experimental 2 Treffer
- evaluacion prestacion 2 Treffer
- evaluation performance 2 Treffer
- fundamental areas of phenomenology (including applications) 2 Treffer
- genie mecanique. construction mecanique 2 Treffer
- hybrid microelectronics; thick films 2 Treffer
- linear model 2 Treffer
- materials testing 2 Treffer
- mechanical engineering. machine design 2 Treffer
- methode mesure 2 Treffer
- micro- and nanoelectromechanical devices (mems/nems) 2 Treffer
- microelectromechanical device 2 Treffer
- micromachining 2 Treffer
- microusinage 2 Treffer
- modele lineaire 2 Treffer
- modelo lineal 2 Treffer
- noise 2 Treffer
- nondestructive testing 2 Treffer
- performance evaluation 2 Treffer
- accelerometer 1 Treffer
- accelerometre 1 Treffer
Verlag
Publikation
- photon processing in microelectronics and photonics (san jose ca, 21-24 january 2002) 2 Treffer
- defense, security, and cockpit displays (orlando fl, 14-16 april 2004) 1 Treffer
- earth observing systems iv (denver co, 18-20 july 1999) 1 Treffer
- electronic imaging : processing, printing, and publishing in color (zurich, 18-20 may 1998) 1 Treffer
- imac xvii : 17th international modal analysis conference (kissimmee fl, 8-11 february 1999) 1 Treffer
-
8 weitere Werte:
- image and signal processing for remote sensing ix (barcelona, 9-12 september 2003) 1 Treffer
- metrology, inspection, and process control for microlithography xix (san jose ca, 7-10 march 2005) 1 Treffer
- micromachining and microfabrication process technology vii (san francisco ca, 22-24 october 2001) 1 Treffer
- nondestructive evaluation of aging aircraft, airports, and aerospace hardware iii (newport beach ca, 3-5 march 1999) 1 Treffer
- nondestructive evaluation of aging materials and composites iv (newport ca, 8-9 march 2000) 1 Treffer
- nondestructive evaluation of materials and composites v (newport beach, 7-8 march 2001) 1 Treffer
- optical data storage 2004 (monterey ca, 18-21 april 2004) 1 Treffer
- reliability, testing, and characterization of mems/moems (san francisco ca, 22-24 october 2001) 1 Treffer
Sprache
14 Treffer
-
In: IMAC XVII : 17th international modal analysis conference (Kissimmee FL, 8-11 February 1999), 1999, S. 342-348KonferenzZugriff:
-
In: Metrology, inspection, and process control for microlithography XIX (San Jose CA, 7-10 March 2005), 2005KonferenzZugriff:
-
In: Defense, security, and cockpit displays (Orlando FL, 14-16 April 2004), 2004, S. 277-287KonferenzZugriff:
-
In: Image and signal processing for remote sensing IX (Barcelona, 9-12 September 2003), 2004, S. 560-568KonferenzZugriff:
-
In: Optical data storage 2004 (Monterey CA, 18-21 April 2004), 2004, S. 289-296KonferenzZugriff:
-
In: Photon processing in microelectronics and photonics (San Jose CA, 21-24 January 2002), 2002, S. 386-396KonferenzZugriff:
-
In: Photon processing in microelectronics and photonics (San Jose CA, 21-24 January 2002), 2002, S. 571-580KonferenzZugriff:
-
In: Micromachining and microfabrication process technology VII (San Francisco CA, 22-24 October 2001), 2001, S. 77-84KonferenzZugriff:
-
In: Reliability, testing, and characterization of MEMS/MOEMS (San Francisco CA, 22-24 October 2001), 2001, S. 277-286KonferenzZugriff:
-
In: Nondestructive evaluation of aging materials and composites IV (Newport CA, 8-9 March 2000), 2000, S. 68-77KonferenzZugriff:
-
In: Earth observing systems IV (Denver CO, 18-20 July 1999), 1999, S. 376-387KonferenzZugriff:
-
In: Nondestructive evaluation of aging aircraft, airports, and aerospace hardware III (Newport Beach CA, 3-5 March 1999), 1999, S. 223-229KonferenzZugriff:
-
In: Nondestructive evaluation of materials and composites V (Newport Beach, 7-8 March 2001), 2001, S. 204-210KonferenzZugriff:
-
In: Electronic imaging : processing, printing, and publishing in color (Zurich, 18-20 May 1998), 1998, S. 118-128KonferenzZugriff: