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Weniger Treffer
Gefunden in
Art der Quelle
Schlagwort
- cvd 11 Treffer
- depot chimique phase vapeur 10 Treffer
- croissance film 7 Treffer
- film growth 7 Treffer
- spectre photoelectron rx 7 Treffer
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45 weitere Werte:
- x-ray photoelectron spectra 7 Treffer
- condensed matter: structure, mechanical and thermal properties 5 Treffer
- etat condense: structure, proprietes mecaniques et thermiques 5 Treffer
- etude experimentale 5 Treffer
- experimental study 5 Treffer
- structure and morphology; thickness 5 Treffer
- structure et morphologie de couches minces 5 Treffer
- structure et morphologie; epaisseur 5 Treffer
- surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) 5 Treffer
- surfaces et interfaces; couches minces et trichites (structure et proprietes non electroniques) 5 Treffer
- thin film structure and morphology 5 Treffer
- in situ 4 Treffer
- silicon oxides 4 Treffer
- atomic force microscopy 3 Treffer
- couche mince 3 Treffer
- infrared spectra 3 Treffer
- microscopie force atomique 3 Treffer
- o si 3 Treffer
- raman spectra 3 Treffer
- silicium oxyde 3 Treffer
- spectre ir 3 Treffer
- spectre raman 3 Treffer
- structure surface 3 Treffer
- surface structure 3 Treffer
- thin films 3 Treffer
- transition element compounds 3 Treffer
- addition hydrogene 2 Treffer
- aes 2 Treffer
- atomic layer method 2 Treffer
- binary compounds 2 Treffer
- c n 2 Treffer
- carbon nitrides 2 Treffer
- carbone nitrure 2 Treffer
- coatings 2 Treffer
- compose binaire 2 Treffer
- composition surface 2 Treffer
- condensed matter: electronic structure, electrical, magnetic, and optical properties 2 Treffer
- deposition rate 2 Treffer
- epaisseur 2 Treffer
- etat condense: structure electronique, proprietes electriques, magnetiques et optiques 2 Treffer
- hydrogen additions 2 Treffer
- inductively coupled plasma 2 Treffer
- mechanical strength 2 Treffer
- metal transition compose 2 Treffer
- methode couche atomique 2 Treffer
Publikation
- ecasia'01: proceedings of the 9th european conference on applications of surface and interface analysis, 30th september-5th october 2001, avignon, france 2 Treffer
- 5th international symposium on atomic level characterizations for new materials and devices (alc'05) 1 Treffer
- ecasia 99, sevilla, spain, 4-8 october 1999 1 Treffer
- surface analysis '99 1 Treffer
Sprache
13 Treffer
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In: Surface and interface analysis, Jg. 44 (2012), Heft 10, S. 1319-1323Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 38 (2006), Heft 7, S. 1122-1129Online academicJournalZugriff:
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In: 5th International symposium on Atomic Level Characterizations for new materials and devices (ALC'05), Jg. 38 (2006), Heft 12-13, S. 1692-1695Online KonferenzZugriff:
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In: ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France, Jg. 34 (2002), Heft 1, S. 681-685Online KonferenzZugriff:
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In: ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France, Jg. 34 (2002), Heft 1, S. 423-431Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 44 (2012), Heft 4, S. 456-465Online academicJournalZugriff:
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In: Surface Analysis '99, Jg. 29 (2000), Heft 3, S. 201-207Online KonferenzZugriff:
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In: ECASIA 99, Sevilla, Spain, 4-8 October 1999, Jg. 30 (2000), Heft 1, S. 603-606Online KonferenzZugriff:
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In: Surface and interface analysis, Jg. 41 (2009), Heft 1, S. 44-48Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 40 (2008), Heft 11, S. 1488-1492Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 29 (2000), Heft 6, S. 369-376Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 27 (1999), Heft 7, S. 638-643Online academicJournalZugriff:
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In: Surface and interface analysis, Jg. 24 (1996), Heft 1, S. 1-6Online academicJournalZugriff: